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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 4
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ABOUT THE AUTHORS
AndreaBahgat Shehata
receivedhisB.S., M.S., andPh.D. degrees (summa cumlaude) inelectronics
engineering from the Politecnico di Milano, Milan, Italy, in 2007, 2009, and 2013, respectively. In 2013
he joined the IBMT.J. Watson Research Center, YorktownHeights, NY, as a postdoctoral researcher. His
current research interests include the development and characterization of new systems for testing
very-large-scale integration circuits based on static imaging and time-resolved emission. Dr. Bahgat
Shehataworkedwith low-jitter andhigh-quantum-efficiency SSPDs, pushing their limits toward record
low-voltage applications. He hasmore than 45 publications. In 2015, Dr. Bahgat Shehatawas awarded
the Paul F. Forman Team Engineering Excellence Award.
Franco Stellari
received M.S. and Ph.D. degrees in electronics engineering from the Politecnico
di Milano, Italy, in 1998 and 2002, respectively. He subsequently joined the IBMT.J. Watson Research
Center as a postdoctoral researcher, becoming a research staff member in 2004. His major interests
are the development and use of new optical methodologies for very-large-scale integration circuit
testing and hardware security. He has more than 85 international publications and more than 24
patents. Dr. Stellari has been the recipient of four Best Paper Awards and the Paul F. Forman Team
Engineering Excellence Award.
Peilin Song
is a Principal Research Staff Member at the IBM T.J. Watson Research Center, where
he manages the Circuit Diagnostics and Testing Technology Department. He joined IBM in 1997 and
has since worked in the area of design for testability, fault diagnostics, optical testing, and recently
hardware security and reliability. Dr. Song has more than 100 publications and holds more than 38
U.S. patents, with several patents pending. In 2004, he won the IEEE Electron Device Society Paul
Rappaport Award. Dr. Song is an IEEE Senior Member. He received his Ph.D. in electrical engineering
from the University of Rhode Island in 1997.
SUPERCONDUCTING SINGLE‑PHOTON DETECTOR
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ITC 2016
The International Test Conference (ITC) will be held
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