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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 1
ABOUT THE AUTHOR
David Burgess
is a failure analyst and reliability engineer. He developed techniques and taught
in those areas at Fairchild Semiconductor and Hewlett-Packard. He is the founder of Accelerated
Analysis, a manufacturer and distributor of specialty failure analysis tools. David is the co-author of
Wafer Failure Analysis for Yield Enhancement
. A graduate of Rensselaer Polytechnic Institute and San
Jose State University, he is a member of EDFAS and has served on various ISTFA committees. David is
a Senior Life Member of IEEE and was General Chairman of the 1983 International Reliability Physics
Symposium (IRPS).
2017 FIB/SEMWORKSHOP
The tenth annual FIB/SEMWorkshop will be held on
Thursday, March 2, 2017,
at the National Institute of Standards
and Technology (NIST) in Gaithersburg, Md. It features a full day of technical content and plenty of opportunities for
informal discussion with your FIB colleagues.
For more information, contact the following organizers: Nabil Bassim,
bassimn@mcmaster.ca; Ken Livi,
klivi@jhu.edu;
or Keana Scott,
keana.scott@nist.gov.
NOTEWORTHY NEWS
2017 IRPS CONFERENCE
The IEEE International Reliability Physics Symposium’s (IRPS) annual conference will be
held
April 2 to 6, 2017,
at the Hyatt Regency in Monterey, Calif.
The IRPS technical program includes technical sessions, keynote and invited talks on
emerging issues, tutorials, workshops, an evening poster session, a year-in-review seminar, panel discussions, and equip-
ment demonstrations. Special attention is given to the reliability of advanced CMOS scaling, newmaterials introduction,
new processes or integration strategies, and/or fundamentally new device architectures. Attendees returning from the
IRPS will be better equipped to solve critical reliability problems and develop effective qualification procedures that
affect their companies’ bottom line.
The IRPS Conference is sponsored by the IEEE Reliability Society and IEEE Electron Device Society. For more informa-
tion, visit the IRPS website at irps.org.
NOTEWORTHY NEWS