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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 2 Contact Information
ANADEF 2016
Tel: 09 71 40 72 74
Web:
ASMC 2016
Margaret Kindling
Tel: 202.393.5552
e-mail:
Web:
ASM International
Tel: 800.336.5152, ext. 0
e-mail:
Web:
IMEC
Tel: +32 16 28 12 11
e-mail:
Web:
Lehigh Microscopy School
Sharon Coe
Tel: 610.758.5133
e-mail:
Web:
McCrone Group
Tel: 630.887.7100
Web:
Semitracks, Inc.
Tel: 505.858.0454
e-mail:
Web:
MICROSCOPY &MICROANALYSIS 2016 MEETING
The Microscopy & Microanalysis (M&M) 2016 meeting will be held July 24 to 28, 2016 , at the Columbus Convention
Center in Columbus, Ohio. The Scientific Program features the latest advances in the biological and physical sciences as
well as techniques and instrumentation. Complementing the program is one of the largest exhibitions of microscopy and
microanalysis instrumentation and resources in the world. Educational opportunities include a variety of Sunday short
courses, tutorials, evening vendor tutorials, pre-meeting workshops, and in-week intensive workshops. The opening
reception offers an opportunity to meet new people in the field and renew old acquaintances, and the Monday morning
Plenary Session features showcase talks from outstanding researchers as well as recognition of the major Society and
Meeting awardwinners. Therewill be other important awards conferred during themeeting, including daily poster awards
to highlight the best student posters in instrumentation and techniques as well as biological and physical applications
of microscopy and microanalysis.
M&M is sponsored by the Microscopy Society of America and the Microanalysis Society. For more information, visit
or .
NOTEWORTHY NEWS
IPFA 2016
The 23rd International Symposium on the Physical and Failure Analysis of Integrated
Circuits (IPFA 2016) will be held July 18 to 21, 2016, at Marina Bay Sands, Singapore. The
event will be devoted to the fundamental understanding of the physical mechanisms of
semiconductor device failures as well as issues related to semiconductor device reliability and yield, especially those
related to advanced process technologies.
IPFA 2016 is organized by the IEEE Reliability/CPMT/EDSingapore Chapter. The Symposium is technically co-sponsored
by the IEEE Electron Device Society and IEEE Reliability Society.
For more information, visit the IPFA website at
NOTEWORTHY NEWS