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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 2
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TRAINING CALENDAR Courses in failure analysis
and related topics
SEMICONDUCTOR ONLINE TRAINING
EDFAS offers online training specialized for semiconductor, microsystems, and nanotechnology suppliers and users.
These online training courses are designed to help engineers, technicians, scientists, and managers understand each of
these dynamic fields. This one-year subscription provides access to several courses covering semiconductor failure analy-
sis, design, packaging, processing, technology, and testing. Find out more by visiting and clicking on Education.
Rose M. Ring, Globalfoundries
June 2016 (cont'd)
EVENT DATE LOCATION
Metallography for
Failure Analysis
5/2-5 Novelty, OH
Contact: ASM International
27th Annual
SEMI Advanced
Semiconductor
Manufacturing
Conference
5/16-19 Saratoga Springs,
NY
Contact: ASMC 2016
Failure and Yield
Analysis
5/17-20 Munich, Germany
EOS, ESD and How to
Differentiate
5/23-24 Munich, Germany
Semiconductor
Reliability and
Qualification
5/30-6/2 Munich, Germany
Contact: Semitracks, Inc.
IMEC Technology
Forum 2016 Brussels
5/24-25 Brussels, Belgium
Contact: IMEC
May 2016
EVENT DATE LOCATION
Scanning Transmission
Electron Microscopy:
From Fundamentals to
Advanced Applications
6/6-10 Bethlehem, PA
Contact: Lehigh Microscopy School
Advanced Imaging
Techniques for
Scanning Electron
Microscopy
6/6-7 Westmont IL
Advanced X-Ray
Microanalysis by EDS
6/8-10 Westmont IL
Polarized Light
Microscopy
6/13-17 Westmont IL
Microscopy Workshop
for Middle and High
School Science
Teachers
6/20-24 Westmont IL
Contact: McCrone Group
Advanced Thermal
Management and
Packaging Materials
6/7-8 Albuquerque, NM
Contact: Semitracks, Inc.
ANADEF Workshop
2016
6/7-10 Seignosse-
Hossegor (Landes),
France
Contact: ANADEF 2016
Scanning Electron
Microscopy
6/13-16 Lansing, NY
Introduction to
Metallurgical Lab
Practices
6/20-22 Novelty, OH
Contact: ASM International
June 2016
EVENT DATE LOCATION
Introduction to SEM
and EDS for the New
Operator
6/5 Bethlehem, PA
Scanning Electron
Microscopy and X-Ray
Microanalysis
6/6-10 Bethlehem, PA
Focused Ion Beam:
Instrumentation and
Applications
6/6-10 Bethlehem, PA
Problem Solving:
Interpretation and
Analysis of SEM/EDS/
EBSD Data
6/6-10 Bethlehem, PA
Quantitative X-Ray
Microanalysis: Problem
Solving Using EDS and
WDS Techniques
6/6-10 Bethlehem, PA
July 2016
EVENT DATE LOCATION
IMEC Technology
Forum 2016 USA
7/11 San Francisco, CA
Contact: IMEC
Semiconductor
Reliability
7/11-13 Singapore,
Singapore
Contact: Semitracks, Inc.