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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 2
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PRODUCT NEWS CONTINUED FROM
PAGE 40
signal analysis,” saidMario Narduzzi, marketingmanager
of Keysight’s Communications Solutions Group. “When
engineers choose the X-Series, they get accessible per-
formance that puts them closer to the answers they need
to achieve their own breakthroughs at radio, microwave,
and millimeter-wave frequencies.”
NANOPOSITIONING CONTROLLER
AVAILABLE FROM nPOINT
LC.300 digital controllers from nPoint (Middleton,
WI) are designed to operate closed-loop, flexure-guid-
ed nanopositioners with smooth linear motion and
nanometer precision. nPControl Basic Software offers
the capability to easily change proportional integral-
derivative control parameters and apply notch filters
via Windows-based graphical user interface. Controllers
are compatible with capacitive or strain-gauge sensing
technology for closed-loop operation. The LC.300 was
designedwith a small footprint for simple integration into
original equipment manufacturer (OEM) environments.
When combined with nPoint’s line of nanopositioning
stages, the LC.300’s 20-bit resolution provides subnano-
meter positioning capabilities. As the latest addition to
nPoint’s nanopositioning electronics, the LC.300 series
can be used in a variety of industries as an OEM system
component.
Application examples include life science, microscopy,
semiconductors, data storage, optics, materials science,
and photonics packaging.
Formore information: web: ; e-mail:
.
RBD INSTRUMENTS OFFERS
AES ANALYZER
RBD Instruments, Inc. (Bend, Ore.) announced the
release of the microCMA, its latest instrument for analyz-
ing the top-most atomic layers of materials. “We are very
excited to bring this new product to the surface analysis
market. Itwill be an invaluable tool for researchers and sci-
entists at universities and research facilities worldwide,”
said Randy Dellwo, President of RBD.
ThemicroCMA is a compact cylindrical mirror analyzer
(CMA) that measures the kinetic energies of electrons
emitted from materials in a vacuum chamber. This type
of analyzer is used in the Auger electron spectroscopy
(AES) surface analysis technique, which is named after
the French physicist Pierre Auger, who co-discovered the
effect in the 1920s.
In use since the 1950s, AES has become a practical
characterization technique in research areas such as
surface chemistry and thin films. The first commercial
To characterize signal interactions in dense radar
environments, the UXA and PXA support real-time data
streaming at up to 255 MHz bandwidth with 16-bit reso-
lution at 300 MSa/s. When coupled with a data recorder
from solution-partner X-COM Systems, the analyzers
support real-time acquisition with up to 15 TB (>3 h) of
capture memory.
X-Series applicationswithmultitouch simplify complex
operations with proven, ready-to-use measurements for
pulse analysis, analog demodulation, noise figure, phase
noise, LTE/LTE-Advanced, and wideband code-division
multiple access. The new pulse application accelerates
the development and verification of chirped wideband
signals, such as those used in advanced radars. Updates
to the LTE/LTE-A application simplify characterization of
systems that use carrier aggregation by supporting 256
quadrature amplitude modulation and providing visible
configuration of all component carriers.
Using the strengths of the X-Series, the new N896xB
noise-figure analyzer X-Series include a larger display,
multitouch UI, and improved performance compared to
their predecessors. These capabilities enhance a user’s
ability tomake fast, accurate, and repeatable noise-figure
measurements up to 40 GHz with a dedicated solution.
For more information: web:
tel: 970.679.5397; e-mail:
Keysight’s N9040B UXA X-Series signal analyzer
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