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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 2
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Jeremy Johnson
received a Ph.D. from the University of Texas at Austin. He holds undergradu-
ate degrees in physics and classical studies from the University of Texas at Arlington. Dr. Johnson is
pursuing a career in software development with his company 4th Wall Games.
S.V. Nguyen
is the founder of Braket Technologies, a technology company
combining advanced sensors and algorithms to usher in a cleaner economy.
Since graduating with a B.S. degree from the University of Texas at Austin and
a Ph.D. in physics fromHarvard University, Dr. Nguyen has spent over a decade
in the energy industry. Prior to Braket, he was at Autonomous Marine Systems,
Genie Oil and Gas, and Shell Oil Company. Dr. Nguyen is the holder of 14 U.S. patents and the author
of 15 peer-reviewed publications.
MICROSCOPY &MICROANALYSIS 2017 MEETING
The Microscopy & Microanalysis (M&M) 2017 meeting will be held
Aug. 6 to 10, 2017,
in St. Louis, MO, with a theme of
“Anniversaries.” The Scientific Program features the latest advances in the biological, physical, and analytical sciences
as well as techniques and instrumentation along with special anniversary lectures. A special symposium will celebrate
50 years of atom probe tomography. Complementing the program is one of the largest exhibitions of microscopy and
microanalysis instrumentation and resources in the world. Educational opportunities include a variety of Sunday short
courses, tutorials, evening vendor tutorials, pre-meeting workshops, and in-week intensive workshops. The opening
reception offers an opportunity to meet new people in the field and renew old acquaintances, and the Monday morning
Plenary Session features showcase talks from outstanding researchers as well as recognition of the major Society and
Meeting awardwinners. Therewill be other important awards conferred during themeeting, including daily poster awards
to highlight the best student posters in instrumentation and techniques as well as biological and physical applications
of microscopy and microanalysis.
M&M is co-sponsored by the Microscopy Society of America and the Microanalysis Society and, for the first time, by
the International Field Emission Society. For more information, visit microscopy.org/MandM/2017.
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