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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 2
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Accelerated Analysis...................................................... 56
Allied High Tech........................................................ 28-29
ASM International.......................................................... 31
Checkpoint................................................................ 38-39
Digit Concept. ......................................................... 11 / 35
Hamamatsu. .................................................................... 3
IR Labs............................................................................ 43
JEOL. ................................................................................ 9
Oxford Instruments............................ Outside back cover
Quantum Focus Instruments........................................ 41
Semicaps........................................................................ 33
SPI Supplies................................................................... 15
Ultra Tec..................................... Inside front/back covers
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CANDIDATE PROFILES CONTINUED FROM
PAGE 34
assumed ownership of the FIB circuit edit operation.
He later transitioned into management of the Freescale
Global Yield FA Laboratories, where he was responsible
for FA teams in Arizona and Malaysia.
Before transitioning to the FA world, Ryan worked at
Intel’s Chandler Assembly and Test location after earning
his Bachelor of Science degree in electronic engineering
technology from DeVry Institute of Technology.
Active in ISTFA, Ryan was a panelist on the ISTFA 2015
NewProduct IntroductionPanel, authoredor co-authored
four papers, served as Co-Chair of the Circuit Edit Session
(2009), and reviewed submissions for the ISTFA 2012
Photon-Based Techniques Committee.
VISION STATEMENT
“It is now more important than ever to have a strong
failure analysis community promotingworldwide interac-
tion and knowledge-sharing between like-minded failure
analysis experts. The role of EDFAS in ensuring this com-
munity remains focused on advancing our craft is amajor
driver propelling our industry forward year after year. It is
critical we engagewithuniversities andearly-career failure
analysis employees and nurture their interest and partici-
pation to keep our Society going forward. The health of
EDFAS is critical to the failure analysis community, and I
hope to bring fresh ideas and diverse viewpoints, which
aid in the continued success and continuing improvement
of EDFAS.”