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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 2
10
3. “Resolution,” The Free Dictionary,
definition 6.
4. “Repeatability,” Wikipedia,
5. “RenishawData Sheet L-9517-0182-05-C,”
6. “THK Document 508-1E,” THK Company, Ltd.,
p. A1-75.
7. “Carbide Miniature End Mills—Square,” Harvey Tool,
8. “Rego-FixCompleteCatalog,”Rego-FixAG ,2013,pp.3,5.
ABOUT THE AUTHORS
Kirk Martin has 40 years of experience in designing and building specialized equipment for all
aspects of the semiconductor industry, from crystal growth through final test and failure analysis. In
2005, he became a founder of RKD Engineering, which designs and builds equipment for semicon-
ductor failure analysis and sample preparation. Kirk has patents in the fields of sample preparation,
chemical vapor generation, and electrostatic discharge detection and mitigation.
Nancy Weavers has 30 years of experience in applications in the semicon-
ductor and test equipment industries. She started at National Semiconductor in
1982. In 2006, she became the Chief Executive Officer of Left Coast Instruments, a semiconductor test
equipment and electron microscope imaging sales and marketing company. She sits on the Board of
Advisors for the San Joaquin Delta ElectronMicroscopy Program. Previously, she was a Vice President
at Nisene Technology Group.
A DISCUSSION OF THE MECHANICAL LIMITATIONS OF MACHINERY (continued from page 8)
ESREF 2016
The 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF ’16) will take
place September 19 to 22, 2016, in Händel-Halle, Halle (Saale), Germany. The conference continues to focus on recent
developments and future directions in quality, robustness, and reliability research of materials, components, integrated
electronic circuits/systems, and their nano-, micro-, power-, and optoelectronics devices. ESREF provides the leading
European forum for developing all aspects of reliability management and failure prevention for present and future elec-
tronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.
For more information, visit .
NOTEWORTHY NEWS
ANADEF WORKSHOP
The 15th ANADEFWorkshopwill be held June 7 to 10, 2016, at Belambra Business Club, Seignosse-Hossegor (Landes),
France. The conference addresses new issues related to the latest technological developments in electronic component
failure analysis, presented through tutorials, plenary sessions, micro-workshops, as well as participation by equipment
manufacturers and suppliers.
ANADEF, a French nonprofit scientific society established in 2001, meets biennially to bring together industry experts
and mechanism scientists concerned with the prevention, detection, and failure analysis of electronic components and
assemblies. For more information, visit .
NOTEWORTHY NEWS