Learn more about the versatility and performance of this new generation of analytical SEMs. Select the right SEM for your lab and budget from the JEOL FE SEM series. www.jeolusa.com salesinfo@jeol.com • 978-535-5900 • Outstanding low kV/low vacuum performance • Ultrahigh resolution imaging and nanoanalysis of structures, surface details, and magnetic samples • Multi-port chamber allows in situ nanolab utility • Ask us about the new JEOL soft X-ray emission spectrometer JSM-7100F/LV • JSM-7100F T/LV • JSM-7610F • JSM-7800F/LV • JSM-7800F Prime www.jeolusa.com/FESEM Polycrystalline silicon specimen analyzed using EBSD and JEOL FE SEM