October_AMP_Digital

29 / 50

Exhibition
ISTFA is the only international venue devoted to the semicon-
ductor, electronic sample preparation, and imaging markets. It attracts
attendees from all major global geographic areas, offers a comprehensive prac-
tical and theoretical technical program that attracts the broadest mix of attendees, and
continually expands topic areas to attract new and diverse audiences. ISTFA offers two full
days of dedicated expo hours to make connections, build relationships, and generate sales.
ADVANCED MATERIALS & PROCESSES • OCTOBER 2014 29
Failure Analysis
November 9-13, 2014
Houston
Wednesday, November 12
8:00 – 9:00 a.m.
Fundamentals of Laser Signal Injection Microscopy
8:00 – 10:00 a.m.
Oil & Gas Microelectronics Failure Analysis:
Methodologies and Selected Case Studies
10:15 a.m. – 12:15 p.m.
Panel Discussion
Session chair: Philippe Perdu
1:30 – 3:30 p.m.
Posters
Session chairs: Martin Versen and David Grosjean
3:30 – 4:20 p.m.
Circuit Edit
Session chairs: Dane Scott and Michael DiBattista
3:30 – 6:00 p.m.
Sample Preparation and Device Deprocessing I
Session chairs: Roger Alvis and Bryan Tracy
4:20 – 6:00 p.m.
Microscopy II
Session chair: Carl Nail
Thursday, November 13
8:00 – 9:40 a.m.
Case Studies and the Failure Analysis Process II
Session chairs: Zhigang Song and Peter Jacob
Sample Preparation and Device Deprocessing II
Session chairs: Roger Alvis and Bryan Tracy
9:50 – 11:30 a.m.
Defect Characterization and Metrology
Session chairs: Phil Kaszuba and Terence Kane
9:50 – 11:55 a.m.
Sample Preparation and Device Deprocessing III
Session chairs: Roger Alvis and Bryan Tracy
12:20 – 2:20 p.m.
Sample Prep User Group
2:30 – 3:45 p.m.
Sample Preparation and Device Deprocessing IV
Session chairs: Roger Alvis and Bryan Tracy
Software-based Techniques, Test, Diagnosis, and Yield
Session chairs: Geir Eide and Mark E. Kimball
3:45 – 5:45 p.m.
FIB User Group
Exhibitor List
Booth Company
217 Asylum Research
308 Keysight Technologies
610 Agilent Technologies
309 Allied High Tech Products Inc.
220 Angstrom Scientific Inc.
616 Applied Beam
405 Bruker Optics
211 BSET EQ
621 CAMECA Instruments Inc.
524 Carl Zeiss Microscopy LLC
203 Checkpoint Technologies LLC
509 DCG Systems
526 Digit Concept
224 E.A. Fischione Instruments Inc.
607 Ebatco
724 EDAX Inc.
125 Electron Microscopy Sciences
304 Evans Analytical Group
608 EXpressLO LLC
209 FA Instruments Inc.
402 FEI Co.
518 Fraunhofer CAM
204 Gatan Inc.
103 Hamamatsu Corp.
310 HiLevel Technology Inc.
119 Hitachi High Technologies
America Inc.
617 HORIBA Scientific
302 Hysitron Inc.
627 IR Labs
218 ibss Group Inc.
213 JEOL USA Inc.
619 JG & A Metrology Center
116 Keyence Corp.
521 LatticeGear LLC
417 Left Coast Instruments
609 Leica Microsystems
Booth Company
504 Materials Analysis Technology
Inc.
613 Meiji Techno America
117 Mentor Graphics
303 MultiProbe Inc.
421 Nanolab Technologies
612 Neocera LLC
118 Nisene Technology Group
625 NIST/CNST
113 Nordson DAGE
425 OKOS
616 Olympus
217 Oxford Instruments America
126 Precision Surfaces International
110 Quantum Focus Instruments
225 Quartz Imaging Corp.
419 RKD Engineering
505 Robson Technologies Inc.
516 SAMCO Inc.
424 SEMICAPS
725 Semitracks Inc.
527 Sonix
520 Sonoscan Inc.
316 SPI Supplies
519 Synopsys Inc.
127 Ted Pella Inc.
503 TeraView
325 Tescan USA Inc.
202 Trion Technology
109 ULTRA TEC Manufacturing
Inc.
124 WinTech Nano-Technology
Services Pte. Ltd.
327 XEI Scientific Inc.
502 YXLON Feinfocus
611 Zurich Instruments AG
Exhibitor list current as of August 27, 2014.
EDFAS Photo Contest
The EDFAS Photo Contest is open to all members of the
failure analysis community and is sponsored by the Mem-
bership Committee of the Electronic Device Failure Analy-
sis Society. Images are judged on failure analysis relevance
(35%), aesthetics (35%), and novelty of the technique or
mechanism (30%). First place in each category receives a
wall plaque and one-year complimentary EDFAS member-
ship; second and third places in each category receive award
certificates and one-year complimentary EDFAS member-
ships; and the top 10 entries in each category will be dis-
played at ISTFA 2014 in Houston.
Networking Opportunities
Monday Conference Social Event
Hilton Americas – Houston
7:00 – 9:00 p.m.
Tuesday Expo Networking Reception
5:00 – 6:00 p.m.
Wednesday EDFAS Membership Luncheon and Meeting
12:15 – 1:30 p.m.
Wednesday Dessert and Poster Reception
1:30 – 3:30 p.m.
Visit
for more information.
View of the George
R. Brown Convention
Center, Hilton
Americas-Houston,
and downtown skyline
from Highway 59.
Courtesy of Greater
Houston Convention
and Visitors Bureau.