February_EDFA

edfas.org

ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 1

conductivity of the surface. Withmicromanipulators, local

conductivity can be probed only pointwise.

Measurement of local conductivity is a standard

imaging mode with atomic force microscopy (AFM) in

air and is used as an analytical tool in failure analysis,

measurement of doping concentration, and materials

characterization. However, surface contamination and

the common water film between tip and sample reduce

reliability and repeatability.

Enter the AFSEM, the AFM for the SEM. With its new,

self-sensing conductive cantilevers, it enables correlative

conductivity probing in the vacuum environment of the

SEM and reduces the problems encountered in air. The

cantilevers feature solid platinumtips, reducing tip radius

compared to cantilevers with conductive coatings.

For more information: web: nanosurf.com.

TERAVIEW ADDS NEW TERAHERTZ

APPLICATIONS

TeraView (Cambridge, U.K.), the pioneer and leader in

terahertz technology and solutions, announced further

expansion of its installed instrument base as well as the

addition of new terahertz applications. The company

now has over 100 systems in the field, further establish-

ing TeraView’s position as the leading global provider of

terahertz technology and solutions. TeraView’s systems

are deployed at leading research laboratories and at

production facilities around the world. Key industrial

applications include the pharmaceutical, automotive,

and semiconductor packaging industries.

Recent system sales marked introduction of the

TeraPulse terahertz imager and spectrometer, coinciding

with the launch of the EOTPR 5000, TeraView’s fully auto-

mated terahertz system for the inspection of advanced

semiconductor packaging. TeraView customers are now

located in more than twenty countries around the world,

and systems are deployed across a range of industries

where the unique capabilities of terahertz light overcome

the restrictions of conventional imaging and diagnostic

technologies, including greater accuracy and sensitiv-

ity to faults, defects, and quality variations in customer

products.

Since the initial sale of TeraView’s first system to the

pharmaceutical industry, TeraView has continued to

innovate and expand its systemdeployment and applica-

tion expertise into various industries and countries, with

repeat sales to a technologically diverse customer base.

This expansionhas led to recent appointments of TeraView

agents in Russia, South Korea, Taiwan, and Japan. The

company has also established direct technical support in

the United States and Asia to augment its team in Europe.

Dr. Don Arnone, TeraView’s Chief Executive Officer,

commented, “The fact that we have now sold over 100

turn-key systems into applications in both research and

development and industrial inspection is a milestone

not just for TeraView but for the expansion of terahertz

technology itself and its uses. This expansion is based on

close collaboration with our customers, researchers, and

development engineers across the world, and it demon-

strates the global footprint that terahertz technology now

has across a range of industries and scientific disciplines.”

For more information: web: teraview.com.

NATIONAL INSTRUMENTS ANNOUNCES

NEW OSCILLOSCOPE

National Instruments (Austin, Texas), the provider

of platform-based systems that enable engineers and

scientists to solve the world’s greatest engineering chal-

lenges, announced a new high-speed, high-resolution,

high-voltage oscilloscope. The PXIe-5164 is built on the

open, modular PXI architecture and includes a user-pro-

grammable field-programmable gate array (FPGA) to help

aerospace/defense, semiconductor, and research/physics

applications that require high-voltagemeasurements and

high levels of amplitude accuracy.

“PXI oscilloscopes from National Instruments reduce

test time, increase channel density, and nowdeliver even

better measurement flexibility with the combination of

high bandwidth, resolution, and input voltage,” said Steve

Warntjes, Vice President of Research and Development at

National Instruments. “Our new PXIe-5164 oscilloscope

can make some measurements that box instruments

today just can’t handle. If you want to measure a high-

voltage signal of up to 100 V

at up to 1 GS/s, you can now

use the same instrument to see small signal details that

would normally be hidden by the noise of the instrument,

thanks to the 14-bit analog-to-digital converter.”

The PXIe-5164 features:

• Two 14-bit channels sampled at 1 GS/s with 400 MHz

bandwidth

• Two Category II-rated channels with voltage input

range to 100 V

with programmable offsets allowing

measurements up to ±250 V

• Up to 34 channels to build parallel, high-channel-count

systems in a compact form factor in a single PXI chassis

• A 3.2 GB/s streaming data rate enabled by eight lanes

of PCI Express Gen 2 bus communication