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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 1
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Electronic Device Failure Analysis magazine!
For information about advertising in Electronic Device Failure Analysis, contact
Erik Klingerman, National Account Manager; tel: 440.840.9826;
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Current rate card may be viewed online at asminternational.org/mediakit.
May 2017
EVENT DATE LOCATION
Defect-Based Testing 5/3-4 Munich, Germany
Failure and Yield
Analysis
5/8-11 Munich, Germany
Semiconductor
Reliability and
Qualification
5/15-18 Munich, Germany
Semiconductor
Statistics
5/22-23 Munich, Germany
Contact: Semitracks, Inc.
Michigan Expo & Tech
Forum
5/11 Grand Rapids, MI
Carolinas Expo & Tech
Forum
5/16 Greensboro, NC
Contact: SMTA
Contamination,
Cleaning & Coating
Conference
5/23-24 Amsterdam, The
Netherlands
Contact: SMART Group
Contact Information
ASM International
Tel: 800.336.5152, ext. 0
e-mail:
Web: asminternational.org
CEI-Europe AB
Tel: +46 13 100 730
e-mail:
Web: cei.se
IMAPS France
Tel: 33 1 39 67 17 73
e-mail:
Web: france.imapseurope.org/#minapad-2017
Semitracks, Inc.
Tel: 505.858.0454
e-mail:
Web: semitracks.com
SMART Group
Tel: +44 (0) 208-4322741
Web: smta.org/contamination
SMTA
Tel: 952.920.7682
e-mail:
Web: smta.org
SMTA_SE Asia
Tel: 952.920.7682
e-mail: Jenny Ng,
Web: smta.org/southeast-asia
EVENT DATE LOCATION
Practical Fractography 4/5-6 Lansing, NY
Corrosion 4/24-27 Novelty, OH
Metallography for
Failure Analysis
4/24-27 Novelty, OH
Contact: ASM International
April 2017 (cont'd)