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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 1

22

EDFAAO (2017) 1:22-24

1537-0755/$19.00 ©ASM International

®

T

he 15th ANADEF Workshop (failure analysis and

failure mechanisms of electronic components)

was held June 7 to 10, 2016, at the sea resort Les

uquets in Seignosse, France, near the famous surfing

spot of Hossegor on the Atlantic Ocean. The workshop is

organized by ANADEF, the French Failure Analysis Society,

which meets biennially in a unique, friendly, and inter-

generational spirit. Training and sharing of experiences

and skills on solved and unsolved failure analysis (FA)

case studies, techniques, and tools as well as trends and

the future of FA are presented in a warm, friendly, and

informal but professional manner that includes extended

after-dinner exchanges.

As a record-setting year, the ANADEF Workshop gath-

ered 152 people from a wide industrial and university

The ANADEF 2016 Workshop attendees

The sea resort Les Tuquets

“Oasis Cristallin,” first prize in the ANADEF Photo Contest

ANADEF 2016 WORKSHOP REPORT

Alain Wislez, ANADEF Workshop President, Thales Group

alain.wislez@thalesgroup.com