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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 1

ASM FELLOWS 2016

EDFAS MEMBERS NAMED ASM FELLOWS

The Electronic Device Failure Analysis Society (EDFAS) is proud to announce that three of its members were named to

ASM International’s 2016 Class of Fellows:

Lee Knauss, Philippe Perdu,

and

David Vallett.

In 1969, ASM established the

Fellow of the Society honor to provide recognition to members for their distinguished contributions to materials science

and engineering and to develop a broad-based forum of technical and professional leaders to serve as advisors to the

Society. This year’s awards were presented at ASM’s annual Awards Dinner on Tuesday, October 25, 2016, in Salt Lake City

during Materials Science & Technology 2016.

Dr. Lee Knauss, FASM,

Chief, Technology Transition, IARPA, Washington, D.C., was recognized

“for the development and advancement of magnetic current imaging fault isolation techniques

used in microelectronics failure analysis.”

Dr. Philippe Perdu, FASM,

Microelectronic Senior Expert, CNES,

Toulouse, France, was recognized “for outstanding leadership and techni-

cal contributions toward the development of novel defect localization and

failure analysis techniques applied to microelectronics and microsystems

devices.”

Mr. David Vallett, FASM,

Owner, PeakSource Analytical LLC, Fairfax, Vt.,

was recognized “for sustained outstanding technical contributions, leader-

ship, dissemination of knowledge, and education inmicroelectronic IC fault

isolation and failure analysis technology and magnetic imaging applications, and for articulating

and publicizing major analytical technology hurdles and challenges throughout the industry.”

EDFAS congratulates these gentlemen on achieving the distinguished honor of ASM Fellow.

They join Larry Wagner (2010), Ed Cole (2013), Bill Vanderlinde (2014), and Tom Moore (2015) as

EDFAS members selected for this honor.

EDFAS Vice President Lee Knauss, FASM (left), was onsite to receive his award during MS&T16 in Salt Lake City.

He was congratulated by Ed Cole, FASM (middle), and EDFAS President Zhiyong Wang (right).