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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 4
Contact Information
ASM International
Tel: 800.336.5152, ext. 0
e-mail:
Web: asminternational.org
Bruker Nano Surfaces Division
Tel: 805.967.1400
e-mail:
Web: bruker.com/nano
CSIC 2017
Tel: +44 (0)24 76718 970
e-mail:
Web: cs-international.net/home
ESW 2017
Tel: 803.424.8373
e-mail:
Web: ewh.ieee.org/cmte/ias-esw/
IEDM 2016
Tel: 301.527.0900, ext. 103
e-mail:
Web: ieee-iedm.org
RAMS 2017
Tel: 484.678.1078
e-mail:
Web: RAMS.org
Semitracks, Inc.
Tel: 505.858.0454
e-mail:
Web: semitracks.com
March 2017
EVENT DATE LOCATION
Compound
Semiconductor
International
Conference
3/7-8 Brussels, Belgium
Contact: CSIC 2017
Dallas Expo & Tech
Forum
3/7 Plano, TX
Houston Expo & Tech
Forum
3/9 Stafford, TX
Contact: SMTA
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Electronic Device Failure Analysis magazine!
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Current rate card may be viewed online at
asminternational.org/mediakit.
SMTA
Tel: 952.920.7682
e-mail:
Web: smta.org
SurfaceChar LLC
Tel: 973.903.0660
e-mail:
Web: surfacechar.com
The McCrone Group
Tel: 630.887.7100
Web: mccrone.com