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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 2
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TRAINING CALENDAR Courses in failure analysis
and related topics
SEMICONDUCTOR ONLINE TRAINING
EDFAS offers online training specialized for semiconductor, microsystems, and nanotechnology suppliers and users.
These online training courses are designed to help engineers, technicians, scientists, and managers understand each of
these dynamic fields. This one-year subscription provides access to several courses covering semiconductor failure analy-
sis, design, packaging, processing, technology, and testing. Find out more by visiting edfas.org and clicking on Education.
Rose M. Ring, Qorvo, Inc.
June 2017 (cont'd)
EVENT DATE LOCATION
Defect-Based Testing 5/3-4 Munich, Germany
Failure and Yield
Analysis
5/8-11 Munich, Germany
Semiconductor
Reliability and
Qualification
5/15-18 Munich, Germany
Semiconductor
Statistics
5/22-23 Munich, Germany
Contact: Semitracks, Inc.
Advanced
Metallographic
Techniques
5/8-11 Novelty, OH
Introduction to
Metallurgical Lab
Practices
5/15-17 Novelty, OH
Contact: ASM International
Advanced Topics in
Light Microscopy
5/16-17 Sydney, Australia
Introduction to
Transmission Electron
Microscopy (Biological
Science)
5/23 Sydney, Australia
Introduction to
Scanning Electron
Microscopy
5/31 Sydney, Australia
Contact: AMMRF
May 2017
EVENT DATE LOCATION
Quantitative X-Ray
Microanalysis: Problem
Solving Using EDS and
WDS Techniques
6/5-9 Bethlehem, PA
Scanning Transmission
Electron Microscopy:
From Fundamentals to
Advanced Applications
6/5-9 Bethlehem, PA
Contact: Lehigh Microscopy School
Metallographic
Techniques Blended
(Lab Session)
6/5-6 Novelty, OH
Metallurgy for the Non-
Metallurgist Blended
6/13-14 Novelty, OH
Corrosion 6/13-16 Novelty, OH
Contact: ASM International
Wafer Fab Processing 6/5-8 Portland, OR
Contact: Semitracks, Inc.
Introduction to
Transmission Electron
Microscopy (Physical
Science)
6/23 Sydney, Australia
Mass Spectrometry 6/24-28 Sydney, Australia
Optical and Confocal
Microscopy
6/24-28 Sydney, Australia
Scanning Electron
Microscopy
6/24-28 Sydney, Australia
Contact: AMMRF
July 2017
EVENT DATE LOCATION
Introduction to SEM
and EDS for the New
SEM Operator
6/4 Bethlehem, PA
Focused Ion Beam
(FIB): Instrumentation
and Applications
6/5-9 Bethlehem, PA
Scanning Electron
Microscopy and X-Ray
Microanalysis
6/5-9 Bethlehem, PA
Problem Solving:
Interpretation and
Analysis of SEM/EDS/
EBSD Data
6/5-9 Bethlehem, PA
EVENT DATE LOCATION
Energy-Dispersive
X-Ray Microanalysis
Systems
7/8-12 Sydney, Australia
XRD 7/15-19 Sydney, Australia
Transmission Electron
Microscopy
7/22-26 Sydney, Australia
Contact: AMMRF
Medical Device Design
Validation and Failure
Analysis
7/27-28 Novelty, OH
Contact: ASM International
June 2017