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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 2
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DIRECTORY OF
INDEPENDENT FA PROVIDERS
Rosalinda M. Ring, Qorvo Corp.
Electronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA
service providers for your reference files. The directory lists independent providers and their contact information,
expertise, and types of technical services offered.
FA INSTRUMENTS, INC.
Jim Colvin or Derek Chau
2381 Zanker Rd., Suite 100
San Jose, CA 95131
Tel: 510.851.5555
e-mail:
Web: fainstruments.com
Services: Contract laboratory services and consulting
Tools/Techniques: Frontside/backside photoemission
microscopy, Moire thermal imaging, SIFT, TOF-SIFT,
thermal laser stimulus, ASAP-1 IPS for polishing and
precision sample thinning, Signatone probe station with
dark box and thermal control for TLS cold mapping, heat
mappingwith lock-in INSB camera or FMI-based thermog-
raphy, digital x-ray, etc.
FUJITSU QUALITY LABORATORY
4-1-1, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa
211-8588, Japan
Fujitsu LTD, Kawasaki Office
Materials Analysis Division
e-mail:
Web: fujitsu.com/jp/group/fql/en/services/
Services: Morphology observation; FIB processing; struc-
tural, surface, elemental, and chemical analyses; material
tests; environmental investigation; etc.
Tools/Techniques: Optical microscope, LSM, SEM, TEM,
FIB-SIMS, XRD, EPMA, SEM-WDS/EDX, AES-SAM, XPS,
XRF, electrophoresis, FT-IR, gas chromatography-mass
spectroscopy, etc.
INNOVATECH LABS, LLC
Material Testing Lab Services
13805 First Ave. N., Suite 100
Plymouth, MN 55441
Tel: 763.231.0150 or 888.740.5227
Web: innovatechlabs.com
Services: Materials analysis for manufacturing, quality
control, FA, and research and development
Tools/Techniques: AES, ESCA, FTIR, ion/gas chromatog-
raphy, mass spectrometry, liquid particle counting, SEM/
EDS, light microscopy and imaging, DSC, TGA, melt flow
rate, etc.
MATERIALS RESEARCH LABORATORIES, INC.
290 North Bridge St.
Struthers, OH 44471
Tel: 800.424.1776
e-mail:
Web: mrllab.com
Services: Materials analysis
Tools/Techniques: XPS/ESCA, ISS, high-resolution SAM,
SEM, TEM, SAED, EDS, infrared spectroscopy/micros-
copy (FTIR/microFTIR), laser Raman spectroscopy/
microscopy, UV/VIS/NIR spectroscopy, RGA, metallogra-
phy, light microscopy, gas/liquid/ion chromatography,
physical testing (tensile, shear, etc.), XRD, WDS, STEM,
AFM, STM, XRF, atomic absorption and mass spectros-
copy, thermal analysis (DSC/DTA/TGA), NMR, SIMS/LIMS,
ToF-SIMS, etc.
NANOSCOPE SERVICES LTD.
No. 30, Station Road Workshops
Station Road, Kingswood
Bristol, BS15 4PJ, U.K.
Tel: +44 (0)117 957 6225
e-mail:
Web: nanoscopeservices.co.uk
Services: Circuit nanosurgery, FA, FIBxTEManalysis, liftout
for FIB, reliability testing, cryo dualbeam, etc.
Tools/Techniques:C-SAM, x-ray, device de-cap, FIB circuit
modification, copper deposition, glob topping, EDS
analysis, FIB cross sections (site specific), FIB sections
for QA, FA, and metrology, (S)TEM analysis and foil prep,
customized TEM foils, deep (S)TEM foils, cryo dualbeam,
nanoprototyping, etc.
NIST CENTER FOR NANOSCALE SCIENCE AND
TECHNOLOGY
Robert Celotta
National Institute of Standards and Technology
100 Bureau Dr.
Gaithersburg, MD 20899
Tel: 301. 975.8001
e-mail:
Web: nist.gov/cnst
Services: NanoFab, NanoLab