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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 2
52
LITERATURE REVIEW
T
he current column covers peer-reviewed articles published since 2014 on solar cells, photovoltaics, and light-
emitting diodes (LEDs). Note that inclusion in the list does not vouch for the article’s quality, and category sorting
is by no means strict.
If you wish to share an interesting recently published peer-reviewed article with the community, please forward the
citation to the e-mail address listed above and I will try to include it in future installments.
Entries are listed in alphabetical order by first author, then title (in bold), journal, year, volume, and first page. Note
that in some cases bracketed text is inserted into the title to provide clarity about the article subject.
Peer-Reviewed Literature of Interest to Failure Analysis:
Solar Cells, Photovoltaics, and LEDs
Michael R. Bruce, Consultant
mike.bruce@earthlink.net• A. Bidivillea, T. Matsui, and K. Matsubara:
“Analysis
of Bulk and Interface Defects in Hydrogenated
Amorphous Silicon Solar Cells by Fourier Transform
Photocurrent Spectroscopy,”
J. Appl. Phys.,
2015,
118
,
p. 184506.
• O. Breitenstein, F. Frühauf, J. Bauer, et al.:
“Local Solar
Cell Efficiency Analysis Performed by Injection-
Dependent PL Imaging (ELBA) and Voltage-
Dependent Lock-In Thermography (Local I-V),”
Energy Proced.,
Aug. 2016,
92
, p. 10.
• W. Chen, P. Pareige, and P.R. Cabarrocas:
“Three-
Dimensional Atomic Mapping of Hydrogenated
Polymorphous SiliconSolar Cells [Using AtomProbe
Tomography (APT)],”
Appl. Phys. Lett.,
2016,
108
, p.
253110.
• M. Demant, T. Welschehold, S. Kluska, et al.:
“Microcracks in Silicon Wafers II: Implications on
Solar Cell Characteristics, Statistics and Physical
Origin,”
IEEE J. Photovolt.,
Jan. 2016,
6
, p. 136.
• O. Dupré, R. Vaillon, and M.A. Green:
“A Full Thermal
Model for Photovoltaic Devices,”
Sol. Energy,
2016,
140
, p. 73.
• J. Ebser, D. Sommer, S. Fritz, et al.:
“
p
+
-DopingAnalysis
of Laser Fired Contacts for Silicon Solar Cells by
Kelvin Probe Force Microscopy,”
J. Appl. Phys.,
2016,
119
, p. 105707.
• J.S. Fadal, N.R. Wheeler, D. Zabiyaka, et al.:
“Democratizing an Electroluminescence Imaging
Apparatus and Analytics Project for Widespread
Data Acquisition in PhotovoltaicMaterials,”
Rev. Sci.
Instrum.,
2016,
87
, p. 085109.
• M. Frazão, J.A. Silva, K. Lobato, et al.:
“[Low-Cost]
Electroluminescence [Defect Imaging] of Silicon
Solar CellsUsing aConsumer GradeDigital Camera,”
Measurement,
March 2017,
99
, p. 7.
• F. Frühauf, J. Wong, O. Breitenstein, et al.:
“Finite
Element Simulation of Inhomogeneous Solar Cells
Based on Lock-In Thermography and Luminescence
Imaging,”
Sol. Energy Mater. Sol. Cells,
April 2017,
162
,
p. 103.
• B. Hallam, B. Tjahjono, T. Trupke, et al.:
“Photo-
luminescence Imaging for Determining the Spatially
Resolved Implied Open Circuit Voltage of Silicon
Solar Cells,”
J. Appl. Phys.,
2014,
115
, p. 044901.
• K. Hirose, N. Chinone, and Y. Cho:
“Visualization and
Analysis of Active Dopant Distribution in a p-i-n
Structured Amorphous Silicon Solar Cell Using
Scanning Nonlinear DielectricMicroscopy,”
AIP Adv.,
2015,
5
, p. 097136.
• F.-M. Hsiao, M. Schnedler, V. Portz, et al.:
“Probing
Defect States in Polycrystalline GaN Grown on
Si(111) by Sub-Bandgap Laser-Excited Scanning
Tunneling Spectroscopy,”
J. Appl. Phys.,
2017,
121
,
p. 015701.
• Y. Hu, W. Cao, J. Ma, et al.:
“Identifying PV Module
Mismatch Faults by a Thermography-Based
Temperature Distribution Analysis,”
IEEE Trans. Dev.
Mater. Reliab.,
Dec. 2014,
14
, p. 951.
• V. Huhn, B.E. Pieters, Y. Augarten, et al.:
“Imaging
Photocurrent Collection Losses in Solar Cells,”
Appl.
Phys. Lett.,
2016,
109
, p. 223502.
• D. Lan and M.A. Green:
“Analytical Expressions for