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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 3

52

DIRECTORY OF

INDEPENDENT FA PROVIDERS

Rose Ring, Globalfoundries

rosalinda.ring@globalfoundries.com

E

lectronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA

service providers for your reference files. The directory lists independent providers and their contact information,

expertise, and types of technical services offered.

CONTECH RESEARCH

750 Narragansett Park Dr.

Rumford, RI 02916-1035

Tel: 401.865.6440

e-mail:

info@contechresearch.com

We

b: contechresearch.com

Services:

Environmental, mechanical, and electrical

testing; nondestructive, destructive, surface, and failure

analyses; consulting; etc.

Tools/Techniques:

SEM, SAM, FTIR, fretting corrosion and

evaluation, etc.

FIB SERVICES

1400 S. Sherman St., No. 212

Richardson, TX 75081

Tel: 972.470.9290

Web

: fibservices.com

Services:

Circuit edit (front/backside), TEMsample prepa-

ration, decapsulation, encapsulation, etc.

Tools/Techniques:

V600 FIB with 5 nm resolution

Capability

FINTEXS TECHNOLOGIES SDN. BHD. 

No. 23, 1st Floor, Lorong Helang Dua

Sungai Dua, 11700 Penang, Malaysia

Tel: 604.656.6648

e-mail:

service@fintexs.com.my

Web

: fintexs.com.my

Services:

FA, reliability testing, R&D, etc.

Tools/Techniques:

HALT; HASS; power/thermal cycling;

humidity and thermal shock tests; salt spray and life

testing (long-hour burn-in); high-potential testing; IR

reflow; burn-in; tensile check; drop, functional, vibration,

and compression tests; ionic contamination; cross-

sectioning analysis; SEM; real-time x-ray; ESD testing; etc.

HI-REL LABORATORIES, INC.

6116 N. Freya

Spokane, WA 99217

Tel: 509.325.5800

Web:

hrlabs.com

Services:

Failure, materials, and destructive physical

analyses; nondestructive testing; SEMservices (SEMquali-

fication, wafer lot acceptance, precision metallographic

evaluation); consulting and training; etc.

Tools/Techniques:

C-SAM, real-time x-ray, SEM, EDXA,

FTIR, FIB sectioning, optical microscopy, PIND test, her-

meticity testing, dot marking, external visual, RGA, delid,

bond pull, die shear, 3-D CT x-ray, etc.

INSIGHT ANALYTICAL LABS

11641 Ridgeline Dr., Unit 150

Colorado Springs, CO 80921

Tel: 719.570.9549

Web

: ial-fa.com

Services:

Electronics FA, inspection services, construction

analysis, consulting, etc.

Tools/Techniques:

X-ray inspection, 2-D real-timeand3-D,

SAM including C-mode scanning, optical inspection (dark

field, bright field, polarized, high-resolutionmosaic func-

tionality), IR microscopy, XRF, FTIR, EDS, high-potential

and insulation-resistance testing, cross sectioning of ICs

and PCBs (mechanical and FIB), FIB editing, SEM and

FE-SEM, parallel lapping, dry and wet etching, RIE, STEM

prep and imaging, dye and pry (BGA devices), decapping

and depotting (ICs), solderability analysis, PEM, liquid

crystal analysis, LIVA/TIVA, thermal imaging, electrical

probing, etc.

ITRI INNOVATION

Unit 3, Curo Park

Frogmore, St. Albans

Hertfordshire AL2 2DD U.K.

Tel: +44 (0) 1727 875 544

e-mail:

info@itri.co.uk

Web:

itrilabs.co.uk