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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 3
52
DIRECTORY OF
INDEPENDENT FA PROVIDERS
Rose Ring, Globalfoundries
rosalinda.ring@globalfoundries.comE
lectronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA
service providers for your reference files. The directory lists independent providers and their contact information,
expertise, and types of technical services offered.
CONTECH RESEARCH
750 Narragansett Park Dr.
Rumford, RI 02916-1035
Tel: 401.865.6440
e-mail:
info@contechresearch.comWe
b: contechresearch.comServices:
Environmental, mechanical, and electrical
testing; nondestructive, destructive, surface, and failure
analyses; consulting; etc.
Tools/Techniques:
SEM, SAM, FTIR, fretting corrosion and
evaluation, etc.
FIB SERVICES
1400 S. Sherman St., No. 212
Richardson, TX 75081
Tel: 972.470.9290
Web
: fibservices.comServices:
Circuit edit (front/backside), TEMsample prepa-
ration, decapsulation, encapsulation, etc.
Tools/Techniques:
V600 FIB with 5 nm resolution
Capability
FINTEXS TECHNOLOGIES SDN. BHD.
No. 23, 1st Floor, Lorong Helang Dua
Sungai Dua, 11700 Penang, Malaysia
Tel: 604.656.6648
e-mail:
service@fintexs.com.myWeb
: fintexs.com.myServices:
FA, reliability testing, R&D, etc.
Tools/Techniques:
HALT; HASS; power/thermal cycling;
humidity and thermal shock tests; salt spray and life
testing (long-hour burn-in); high-potential testing; IR
reflow; burn-in; tensile check; drop, functional, vibration,
and compression tests; ionic contamination; cross-
sectioning analysis; SEM; real-time x-ray; ESD testing; etc.
HI-REL LABORATORIES, INC.
6116 N. Freya
Spokane, WA 99217
Tel: 509.325.5800
Web:
hrlabs.comServices:
Failure, materials, and destructive physical
analyses; nondestructive testing; SEMservices (SEMquali-
fication, wafer lot acceptance, precision metallographic
evaluation); consulting and training; etc.
Tools/Techniques:
C-SAM, real-time x-ray, SEM, EDXA,
FTIR, FIB sectioning, optical microscopy, PIND test, her-
meticity testing, dot marking, external visual, RGA, delid,
bond pull, die shear, 3-D CT x-ray, etc.
INSIGHT ANALYTICAL LABS
11641 Ridgeline Dr., Unit 150
Colorado Springs, CO 80921
Tel: 719.570.9549
Web
: ial-fa.comServices:
Electronics FA, inspection services, construction
analysis, consulting, etc.
Tools/Techniques:
X-ray inspection, 2-D real-timeand3-D,
SAM including C-mode scanning, optical inspection (dark
field, bright field, polarized, high-resolutionmosaic func-
tionality), IR microscopy, XRF, FTIR, EDS, high-potential
and insulation-resistance testing, cross sectioning of ICs
and PCBs (mechanical and FIB), FIB editing, SEM and
FE-SEM, parallel lapping, dry and wet etching, RIE, STEM
prep and imaging, dye and pry (BGA devices), decapping
and depotting (ICs), solderability analysis, PEM, liquid
crystal analysis, LIVA/TIVA, thermal imaging, electrical
probing, etc.
ITRI INNOVATION
Unit 3, Curo Park
Frogmore, St. Albans
Hertfordshire AL2 2DD U.K.
Tel: +44 (0) 1727 875 544
e-mail:
info@itri.co.ukWeb:
itrilabs.co.uk