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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 1
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Congratulations to the following winners:
ISTFA 2015 BEST PAPER:
“Visible Light LVP on Bulk Silicon Devices”
Joshua Beutler, Science and Technology, Sandia National
Laboratories
ISTFA 2015 OUTSTANDING PAPER:
“Corrosion Mechanisms of Cu Bond Wires on AlSi Pads”
WentaoQin, Technology Assessment andCharacterization
Lab, ON Semiconductor
ISTFA 2015 BEST POSTER:
“Selective Etching of Highly-p-Doped Si Substrate Using
Low-p-Doped Si epi as an Etch Stop Layer”
Valentina Korchnoy, Intel Israel
ISTFA 2015 OUTSTANDING POSTER:
“MOFM: Magneto-Optical Frequency Mapping System for
Very Low Resistance Short Failure Current Imaging”
Tomonori Nakamura, Hamamatsu Photonics
EDFAS 2015 PHOTO CONTEST
WINNERS
Congratulations to the following winners:
Category I: Color Images
1st Michael Woo, Raytheon Failure Analysis Lab
2nd Joseph Ziebarth, IM Flash Technologies, LLC
3rd Martin Serrano, Raytheon Failure Analysis Lab
Category II: Black & White Images
1st Noel Forrette, IM Flash Technologies, LLC
2nd Luigi Aranda, Raytheon Failure Analysis Lab
3rd Rony R. Celetaria, Analog Devices Gen. Trias, Inc.
Category III: False Color Images
1st Mark Kimball, Maxim Integrated Circuits
2nd Andrew Ozaeta, Raytheon Failure Analysis Lab
3rd Debra L. Yencho, Texas Instruments
All winners received a recognition plaque or certificate
and a one-year EDFAS membership. The winning entries
will be featured on the cover of thismagazine during 2016.
They also may be viewed on the EDFAS website.
EDFAS 2015 VIDEO CONTEST WINNER
Congratulations to the following winner:
“IR Thermography, RunningBug inside Power MOSFET,”
by Kevin Sanchez, Elsa Locatteli, and Florie Mialhe,
Laboratories and Expertise, Quality Assurance, Centre
National d’Etudes Spatiales (CNES), Toulouse, France
The winner received a $50 gift card, a complimentary
registration to a future ISTFA conference, and a first-place
winner plaque. The winning entry may be viewed on the
ISTFA 2016 website.
ISTFA 2015 PANEL DISCUSSION AND USER GROUP SUMMARIES
Summaries of the ISTFA 2015 Panel Discussion and the four User Groups can be found beginning on page S-1 of this
online issue.
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