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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 1
The panel discussion, organized by David Grosjean
of Qualcomm and consultant Kendall Scott Wills, was
extraordinarily well received. The topic was “First Silicon
Debug: Rapid Identification and Correction of Product
Systematic Failures.” People were still coming up to me
the next day to tell me how much they enjoyed the topic
and discussion.
Nicholas Antoniou of ReVera and Rose Ring of
Globalfoundries put together the four User Groups at this
year’s ISTFA. These targeted discussion topics are a great
learning environment for both novice and experienced
users to interact and gain new insights.
ISTFA 2015 attendees enjoying the Expo
General Chair James Demarest and the ISTFA 2015
Organizing Committee
EXPO, ATTENDEE CHAIR, AND
INTERNATIONAL CHAIR
ISTFA isn’t just about the technical program. There are
other critical aspects of the conference that need to be
recognized as well. Efrat Moyal of LatticeGear guided the
Expo Committee through another successful year. It was
wonderful for me to see so many vendors bringing tools
to the Expo, as so much more is learned by sitting down
in front of a piece of equipment and using it.
Felix Beaudoin embraced a challenging role on the
Organizing Committee by becoming the first Attendee
Chair. Felix was charged with improving the overall
attendee experience at the conference, and he more
than exceeded my expectations. Also, it is important to
point out that ISTFA is an international conference, with
approximately half of our presenters coming from coun-
tries outside of the United States. Dr. Lihong Cao of AMD
headed the International Committee in 2015, and she did
an excellent job.
ISTFA SPONSORS
On behalf of the Electronic Device Failure Analysis
Society (EDFAS) and the organizers of ISTFA 2015, we
appreciate your generous sponsorship contribution
and recognize your continued commitment inmaking
the ISTFA Conference and Exposition an outstanding
event.
Premier Sponsor
Digit Concept
Sponsors
Allied High Tech Products, Inc.
Checkpoint Technologies, LLC
DCG Systems
FEI
Hitachi
Mentor Graphics
Nisene Technology Group
Quartz Imaging Corp.
ULTRA TEC Manufacturing, Inc.
Carl Zeiss Microscopy, LLC
Media Sponsors
EDFA
eNews
EDFA
Magazine
All of us on the Organizing Committee extend our
heartfelt thanks for making the conference such a great
experience. We look forward to seeing you next November
in Fort Worth, Texas, at ISTFA 2016!
Visit the Electronic Device Failure Analysis Society website
edfas.org