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A D V A N C E D M A T E R I A L S & P R O C E S S E S | J A N U A R Y 2 0 1 5
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The EM TIC 3X ion beammilling
system, from Leica Microsystems Inc.,
Buffalo Grove., Ill., is now available
with a docking port for vacuum cryo
transfer. The new port enables transfer
at vacuum and/or cryo conditions
with the Leica EM VCT100 vacuum cryo
transfer system. Room temperature or
cryo sections can be taken directly from
the ion beammilling system, loaded
into the vacuum cryo transfer system,
and transferred to the next preparation
step. The new system enables high-
quality surface preparation of hard,
soft, porous, heat sensitive, brittle,
and heterogeneous materials for
microstructure analysis by means of
scanning electron microscopy and
atomic force microscopy.
.
Continental Structural Plastics (CSP),
Auburn Hills, Mich., introduces its Tough
Class A (TCA) Ultra Lite, a 1.2 specific
gravity (SPg) SMC formulation
that gives engineers the ability to
design with a lower specific gravity
material without sacrificing mechanical
properties, surface qualities, or
adhesion requirements. Depending on
the body component being developed,
design studies show that CSP Ultra Lite
offers weight savings up to 21% over
the company’s mid-density TCA Lite
(1.6 SPg) and 35% over its standard TCA
material (1.9 SPg). .
Bruker Corp., Madison, Wis., introduces
the NanoForce nanoindenting and
nanomechanical testing system to
enable full-scale studies of nanoscale
material behavior on a wide range
of specimen geometries, including
thin films, nanostructures, MEMS, and
various device components. The system
features NanoScript measurement
and control software, which enables
real-time experimental control based
on recorded or calculated data. A
gantry design and enclosure cabinet
provide excellent positional accuracy
as well as acoustic and vibration
isolation to establish an optimal testing
environment. A vacuum tray offers
convenience for mounting samples,
and built-in safety features protect the
head assembly during translation of the
X-Y stages. .
Lucideon, UK, published a new white
paper, Understanding Materials
Choices, Their Performance and
Selection. Central to recent progress
in material-driven innovations
and applications is improving
the ability to define materials in
terms of composition, structure,
and performance. This free white
paper affirms the value of materials
characterization in product and
process development activities
in technology-based industries.
Altatech, a division of Soitec, France,
launched the Orion Lightspeed
inspection system, capable of
pinpointing the size and location of
nanoscale defects inside compound
semiconductor materials and
transparent substrates. The system
improves the performance and cost
efficiency of identifying defects within
III-V materials, transparent substrates,
and thin circuit layers on top of
transparent substrates. Inspection
is performed using synchronous
Doppler detection technology, which
determines the exact size and position
of defects by making direct physical
measurements with resolution below
100 nm. The system can handle
substrates up to 300 mm. .
PRODUCTS& LITERATURE
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Epsilon Technology Corp. 53
Inductotherm Group 5, 15
Ipsen Inc. 8
Master Bond Inc. 33
Metropolitan Transportation Authority 33, 53
NSL Analytical Services Inc. 13
Puris LLC IBC
Struers Inc. IFC
Thermo-Calc Software Inc. 7, BC
Tinius Olsen Inc. 19
Westmoreland Mechanical Testing & Research Inc. 53
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