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ADVANCED MATERIALS & PROCESSES •

APRIL 2014

42

l i terature

products &

Instron, Norwood, Mass., announces the MPX Series of

motorized pendulum impact testers

for metals impact

testing to Charpy and Izod standards. The series offers a

range of testing capabilities from 300-900 J and comes

standard with Fracta software, which al-

lows for reliable data acquisition and reporting

of absorbed energy. Upgrading to Impulse

data acquisition software and instrumenta-

tion allows direct measurement of impact

force and striker velocity. MPX is designed

with an automatic test start as soon as the

door closes, allowing for rapid testing. Inter-

changeable hammer weights allow easy ad-

justment of impact energy, eliminating the

need to change hammer shafts. An integrated

guard and safety control system is also in-

cluded.

www.instron.com

.

Arkema, France, launched its first range of

liquid thermo-

plastic resins

under the brand Elium. The resins are trans-

formed using the same processes as composite

thermosets with results that are lightweight, cost-effec-

tive, and recyclable. They polymerize quickly and can be

used to design structural parts and aesthetic elements.

Composite parts made of Elium are 30-50% lighter than

the same parts made of steel and have the same resist-

ance. Because of their thermoplastic properties, the resins

can be used to design composite parts that are easily

thermoformed and recyclable with comparable mechani-

cal performance to epoxy parts.

www.arkemagroup.com

.

Carl Zeiss Microscopy LLC, Thornwood, N.Y., announces

a special promotion on the ZEISS ELYRA P.1, a highly so-

phisticated

3D superresolution light microscope.

Using

PALM or dSTORM techniques, ELYRA P.1 can localize flu-

orescently-labeled struc-

tures in 3D, yielding

achievable resolutions

down to 20 nm laterally

and 50 nm axially. Detec-

tion with an effective reso-

lution down to 20 nm

reveals substructure and

patterns where conventional light microscopy simply

shows co-localization. Users can correlate superresolu-

tion data with electron microscopy images for in-depth

analyses. Special pricing is available for orders received

by Sept. 30.

www.zeiss.com/superrespromo.