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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 18 NO. 3
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PRODUCT NEWS
CONTINUED FROM
PAGE 40
Qontor adds a new dimension to the performance and
ease of use for which inVia is renowned.
The inVia Qontor includes the addition of Renishaw’s
latest innovation, LiveTrack focus-tracking technology,
which enables users to analyze samples with uneven,
curved, or rough surfaces. Optimum focus is maintained
acquiring surface or even subsurface Raman data and
later view the Raman image and surface topography of
their sample in 3-D. This innovation not only saves time
but, in some cases, allows us to analyze samples that were
previously impossible to study.”
The inVia range ofmicroscopes is trustedworldwide to
deliver outstanding performance and reliable results for
even themost challenging experiments. The inVia Qontor
Raman microscope’s cutting-edge technology reduces
overall experiment times and makes it easy to analyze
even the most complex samples.
For more information: web: renishaw.com.
NORDSON DAGE ANNOUNCES QUADRA
X-RAY INSPECTION
Nordson DAGE (Aylesbury, Buckinghamshire)
announced the launch of its fourth-generation ultra-high-
resolution off-line x-ray system, the Quadra series. With
its in-house proprietary QuadraNT tube, Aspire FP detec-
tor, Gensys inspection software, and QuadraGen power
supply, Nordson DAGE offers the future of x-ray image
resolution, reliability, performance, and throughput.
Nordson DAGE’s flagship system, the Quadra with 0.1
μm submicron feature recognition, comes equipped with
two 4 Kultrahigh-definition (UHD) displays. Their 8million
pixels fully show the 50 μm pixel pitch and 6.7 MP image
size of the Aspire FP detector. The 4 K UHD offers up to 4
times the detail compared to standard high-definition
display screens and supports 68,000
×
total magnifica-
tion. Submicron-level features can be seen without a
loss of detail.
The Quadra, with industry-leading core technology,
offers high performance and ease of use for 2-D and 3-D
x-ray applications. The 0.35 μm feature recognition up to
10 W of power, with optional 20 W, makes Quadra 5 the
leading choice for printed circuit board and semiconduc-
tor package inspection.
BenPeecock, Business Director of X-Ray Systems, com-
mented, “The launch of the Quadra series x-ray systems
marks the start of a newand exciting chapter in inspection
solutions for the electronics industry. We have continued
to build on our solid foundation of leading-edge technol-
ogy development while maintaining a real focus on our
customers’ needs. Further vertical integration of the key
elements within the systems has enabled us to remain
in real-time during data collection and white light video
viewing. This removes the need for time-consuming
manual focusing, prescanning, or sample preparation.
The inVia Qontor, equipped with LiveTrack, enables
the acquisition of accurate and reproducible spectra from
samples with extensive topographic variations. Because
a sample’s topography no longer limits Raman imaging
capability, LiveTrack opens up the analysis of awhole new
range of samples and applications.
WithLiveTrack, focusing is dynamic. LiveTrackprovides
continuous feedback to the sample stage, whichadjusts to
follow the height of the sample. This ensures that the laser
maintains focus during data collection and when manu-
ally moving the sample during white light video viewing.
Optimum focus is maintained across uneven, sloping, or
dynamic samples, limited only by the maximum travel
of the stage.
The inVia Qontor enables the analysis of samples
that were previously impractical to study or would have
required extensive sample preparation. For example,
uneven geological samples that normally require sec-
tioning and polishing can now be analyzed without any
sample preparation.
Tim Smith, Renishaw Applications Scientist, said,
“Acquiring in-focus Raman images of your whole sample
is now a reality. Users can track the surface live while
Renishaw’s inVia Qontor Raman microscope
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