edfas.org 41 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 4 NORDSON TEST AND INSPECTION OPENS CENTER OF EXCELLENCE Nordson Test & Inspection is opening a brand new, purpose-built Center of Excellence in Phoenix. The multifunctional building will serve as a state-of-the-art showroom and demonstration facility for customers. It will also operate as a dedicated training and testing facility. The new Center of Excellence is designed to foster collaboration and facilitate knowledge sharing by connecting Nordson’s product and technology experts with a range of visitors, including customers, partners, industry experts and media. PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG LARGE MULTI-SEGMENT EDS DETECTOR SETS BENCHMARK FOR SPEED AND RESOLUTION The XFlash 7200 FIRE is an inclined large area energy dispersive spectroscopy (EDS) detector for scanning electron microscopy (SEM) built on Bruker’s four-segment silicon drift detector (SDD) architecture. The detector establishes a new benchmark for elemental analysis in SEM by overcoming the fundamental throughput and energy resolution limitations of conventional large-area detectors. The latest addition to the Bruker QUANTAX product family features a novel architecture that combines the efficiency of a large area detector with the count rate performance of four independently operating SDD segments. This architecture unlocks levels of analytical performance that were previously unattainable with conventional single-segment detector designs. With a large active area of 200 mm², the XFlash 7200 FIRE delivers extraordinary collection solid angles and at the same time it ensures the higher throughput required for drastically reduced acquisition times without compromising data quality. The detector’s windowless design maximizes detection efficiency, particularly in the low-energy range, thereby enabling highly accurate quantitative elemental analysis with outstanding light element sensitivity. By combining exceptional energy resolution with unprecedented count rate capability, the XFlash 7200 FIRE opens new possibilities for spatial resolution, throughput requirements and demanding analytical applications such as semiconductor devices with demanding peak overlap, battery materials containing light elements, and beamsensitive biological specimens. For more information, visit bruker.com. The XFlash 7200 FIRE combines speed and accuracy for advanced EDS materials characterization. Nordson’s new multipurpose facility serves as a specialized demonstration, training, and testing center. The new complex will operate as a specialized training and testing center where Nordson will provide educational sessions on both new and existing solutions. Among the suite of flagship systems installed at the center are the SQ7000+, SQ5000Pro, SQ3000M2 and FX-940UV optical systems, Quadra7Pro, Quadra5Pro manual x-ray systems, X3 and XS automated x-ray systems, Assure Pro Component Counter, 4800 Integra Plus bond tester, and Gen 7 acoustic system. The wireless, real-time WaferSense semiconductor metrology sensors, designed for semiconductor tool set-up and maintenance, are also available to experience. Visitors will also see firsthand how Nordson continues to advance artificial intelligence, deep learning and machine learning capabilities. For more information, visit nordson.com/en/divisions/ test-and-inspection.
RkJQdWJsaXNoZXIy MTYyMzk3NQ==