edfas.org 37 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 4 DIRECTORY OF INDEPENDENT FA PROVIDERS Rosalinda M. Ring, NenoVision jmj4papa@yahoo.com Electronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. AAA ENGINEERING AND TEST LAB 877.369.6547 customerservice@aaactl.co aaactl.com/services Services Offered: Comprehensive electronic component testing, environmental testing, failure analysis, Hi-Rel, and space qualification. Tools and Techniques: Bond wire harness testing, mechanical testing, Thermostream bench for upscreening C.O.T.S. components, tinning, retinning, and BGA reballing, hot solder dip, solderability testing, tin whisker mitigation, and material composition analysis. Tape and reel packaging, PCB design/construction, custom test design, and project management. COVALENT METROLOGY SERVICES INC. 927 Thompson Pl. Sunnyvale, CA 94085 408.580.0605 covalentmetrology.com Services Offered: Failure analysis and material analysis services specializing in semiconductor, electronics, energy, medical devices, materials science and nanotechnology, analytical support including surface characterization, thin film analysis, materials composition, and dimensional metrology. Tools and Techniques: SEM, transmission electron microscopy (TEM), atomic force microscopy (AFM), and focused ion beam (FIB) techniques; spectroscopic methods such as energy dispersive x-ray spectroscopy (EDS), x-ray photoelectron spectroscopy (XPS), auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), glow discharge optical emission spectroscopy (GDOES), Fourier transform infrared spectroscopy (FTIR), and x-ray fluorescence (XRF); x-ray-based analysis including x-ray diffraction (XRD), high-resolution XRD, and x-ray reflectometry (XRR); ellipsometry and optical profiling using spectroscopic ellipsometry, reflectometry, white light interferometry (WLI), and stylus profilometry; electrical and thin film characterization with four-point probe, hall effect, capacitance-voltage profiling, and film thickness measurement; surface/interface property testing such as surface roughness, contact angle/goniometry, surface energy, and adhesion; advanced sample preparation including cross-sectioning, ion milling, and plasma etching; and custom metrology consulting, data interpretation, and technique selection for R&D and product development. EXPONENTIAL BUSINESS AND TECHNOLOGIES COMPANY (EBATCO) 10025 Valley View Rd., Suite 150 Eden Prairie, MN 55344 952.941.2199 866.832.2826 info@ebatco.com ebatco.com Services Offered: Nano analytical and testing (NAT) laboratory services and consulting. Tools and Techniques: Differential scanning calorimetry (DSC), energy dispersive x-ray spectroscopy (EDS), Fourier transform infrared spectroscopy (FTIR), inductively coupled, plasma optical emission spectroscopy (ICP-OES), modulated DSC, Raman spectroscopy, refractive index, scanning electron microscopy (SEM), simultaneous thermal analysis (STA), thermogravimetric analysis (TGA), color measurement, contact angle, dynamic contact angle, interfacial tension, micro contact angle, powder contact angle, surface free energy, gloss measurement, density, refractive index, rheology, surface/interfacial tension, turbidity, viscosity, mechanical, contact stylus, depth profiling, express property mapping (XPM), macro scratch, micro indentation, micro scratch, modulus mapping, nano DMA, nanoindentation, nano scratch, scratch testing ISO 1518, shore A and shore D hardness, universal testing machine (UTM). FA INSTRUMENTS 36217 Worthing Dr. Newark, CA 94560 510.851.5555 info@fainstruments.com fainstruments.com/service.htm Services Offered: Contract laboratory services and consulting, sample preparation (thinning and end pointing: board, package, and die), microscopy, and analytical skills. HI-REL LABORATORIES 6116 N Freya St. Spokane, WA 99217
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