edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO.4 36 designing for FA and debug. My vision is to ensure that EDFAS will be a globally recognized organization that provides the industry with a reliable source of information. Cecile Bonifacio has more than 20 years of experience in electron microscopy sample preparation, imaging, and analysis. Over this period, she has authored or coauthored more than 100 publications, given presentations at various meetings, and taught in Lehigh University’s Microscopy course. Bonifacio spent the first three years of her career studying electron microscopy and later became a technician for Hitachi Global Storage Technology in San Jose, Calif., and a failure analysis technician for Micron Technology in Virginia. She then pursued advanced degrees in chemical engineering, earning an M.S. at San Jose State University and a Ph.D. at the University of California-Davis. During her doctoral studies and subsequent postdoctoral work at the University of Pittsburgh, she gained expertise in TEM, STEM, and in situ microscopy. Bonifacio joined Fischione Instruments as an applications scientist in 2016. At Fischione, she focuses on developing materials science TEM applications and provides application support for the TEM sample preparation products and the TEM tomography holder product line through customer training and demonstrations. She is currently a senior applications scientist for Fischione. With over nine years of dedicated service to EDFAS and the ISTFA conference, Bonifacio has established herself as a versatile leader, author, and reviewer. Her technical contributions include published works in EDFA magazine and the Journal of Failure Analysis and Prevention, alongside serving as a lecturer for ISTFA conference tutorials on electron microscopy sample preparation and 2025 EDFAS Silicon Valley Failure Analysis Workshop. Bonifacio’s leadership trajectory is marked by high- impact roles, including co-chairing the Sample Preparation User Group (2021-2024) and leading technical sessions in Microscopy, Microanalysis, and Packaging & Physical Failure Analysis (2024-2025). After serving as the 2025 co-Chair for the User Group Overall Committee, she now serves as the Overall User Group Chair. Vision Statement As a candidate for the EDFAS Board, I want to help EDFAS remain the leading global organization for failure analysis, ensuring it stays technically rigorous, welcoming, and relevant as our field advances into advanced packaging, 3D integration, and sub-2 nm nodes. My focus is on strengthening the community through practical means. Connecting experienced analysts with newer practitioners, sharing repeatable methods and standards, and keeping EDFAS at the heart of the conversations that shape how failure analysis is conducted. Mrunal Shah is a yield engineer at GlobalFoundries in Malta, NY, where he focuses on advancing semiconductor technology nodes at 45 nm and below. His work centers on driving yield improvement and product performance through data analysis, root-cause investigations, and failure analysis. He holds an M.S. in electrical engineering and Ph.D. in applied economics from Purdue University and a B.Tech. in computer engineering. During his graduate research, he led international field studies on technology adoption and conducted projects in advanced materials and semiconductor device development. His diverse academic background blends technical innovation with economic and industrial insight, giving him a unique perspective on semiconductor markets and manufacturing. Visit the Electronic Device Failure Analysis Society website edfas.org
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