edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO.4 34 and highly competitive environment, no single organization can advance analytical techniques or equipment in isolation. Progress depends on collaboration, trust, and the effective sharing of knowledge. As secretary, I would work to ensure that EDFAS provides the organizational backbone needed to lower barriers, foster cooperation, and sustain momentum across the community. Through strong governance, clear communication, and careful stewardship of the Society’s collective work, I believe EDFAS can continue to lead the semiconductor failure analysis community forward, supporting innovation, collaboration, and excellence across the industry. Kristofor Dickson recently joined the Device Analysis Pathfinding team at AMD in Austin, Texas, having previously been the Technical Director at NXP Semiconductors. He is currently developing FA solutions related to co-packaged optics, e-beam probe, and active nanoprobe. Dickson graduated from the University of Strathclyde, Glasgow with a bachelor’s degree in laser physics and opto-electronics and a master’s in computer science. Dickson served as 2026 ISTFA General Chair and is chair of the Die-Level Future Roadmap team. He is a member of the EDFAS Lonestar Chapter and is an active mentor with the EDFAS Student & Young Professionals Committee. He has been voted ISTFA Best Paper author in 2022, 2017, and 2010. Vision Statement I view service on the EDFAS Board as an opportunity to support or strengthen programs that engage young engineers, particularly the existing SYP mentoring initiatives, while fostering stronger collaboration with academia to attract the next generation of electrical engineering talent. I am also motivated to deepen EDFAS’s technical impact by exploring closer alignment with ISTFA programs and by promoting cross‑participation with sister conferences such as IPFA, the CAM Workshop, and ESREF. Through these efforts, I hope to enhance EDFAS’s visibility, relevance, and long‑term future. I think EDFAS has a great team and it is a privilege to join to help push ideas forward. Phil Kaszuba is a retired senior member of the Technical Staff for GlobalFoundries and is now employed as a consultant in nanotechnology/semiconductors. He holds a B.S.E.E. from the University of Vermont and has worked in the semiconductor industry for over 43 years at IBM/ GlobalFoundries’ Essex Junction, Vermont fab. He held multiple positions there, including assignments in Product Test, Test Engineering, and Base Technology R&D before settling into the Analytical Services Lab organization in 1992. There he started a Scanning Probe Microscopy Lab in 1993, which he led for 27 years, with his team providing services to IBM/GF worldwide until his retirement in 2020. Over the course of his career, Kaszuba has continually developed novel, state-of-the-art SPM based analytical techniques for nanoscale semiconductor applications. The sample preparation method he developed and published at ISTFA 1995 is the foundation for many methodologies in use today. He has authored numerous articles and papers, including the SPM chapter in the Microelectronics Failure Analysis: Desk Reference, 7th Edition (2019). Kaszuba’s recent work, “Scanning Capacitance Microscopy and Spectroscopy for Root Cause Analysis on Location Specific Individual FinFET Devices” won the Best Paper Award at ISTFA 2019. Kaszuba was elected an ASM Fellow in 2021. Kaszuba has served as an ISTFA session chair for the past 22 years and as a Scanning Probe Microscopy subject matter expert on the Die Level Roadmap Council, contributing to the EDFAS Technology Roadmap. Vision Statement The semiconductor industry continues to evolve at an aggressive, rapid pace. Not only has the demand for cutting edge technologies increased, but also the need for chips built in older, established technologies has exploded. Unprecedented demands have fallen upon the analytical labs that provide critical support to technology development, manufacturing operations, quality control, and failure analysis. There is an increasingly important need to provide accurate analytical data/results faster, more efficiently, and more cost effectively. In order to adequately support these critical needs of the industry it is imperative that dedicated, creative thinkers and stateof-the-art equipment are continually brought into the analytical lab environment. EDFAS is the organization that can help accomplish these objectives and meet both current and future needs in semiconductor device analysis. To ensure a solid future, it is my vision that the EDFAS Board be a driving force to: introduce and recruit young engineers and scientists into the realm of semiconductor analysis; promote innovation and invention in this field, there is so much opportunity here; encourage collaboration between engineers from different companies;
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