edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO.4 28 ABOUT THE AUTHORS Nathan Nakamura is a physicist in the Quantum Sensors Division at NIST Boulder. He joined NIST in 2020 as a National Research Council postdoctoral fellow after receiving his Ph.D. in mechanical engineering from Carnegie Mellon University. His work focuses on the use of classical and quantum sensors for nanoscale x-ray imaging, and the development and deployment of superconducting x-ray sensors for spectroscopy in applications spaces spanning materials science, astrophysics, and fundamental physics. Jordan Fonseca earned his Ph.D. in experimental physics from the University of Washington in 2024, where he studied 2D quantum materials under Professor Xiaodong Xu. He subsequently undertook a postdoc in the Quantum Sensors Division at NIST to develop a fast, lab-based, nanoscale x-ray tomography tool for integrated circuit metrology. In 2026, he joined the Allen Institute for Brain Science to advance petabyte 3D imaging pipelines to map the mouse connectome. Joseph W. Fowler is a research physicist at the NIST Boulder Labs, with degrees in physics from Rice University and the University of Chicago. He has designed, built, and operated multiple astrophysical instruments, including the Atacama Cosmology Telescope, a millimeter-wave telescope for mapping anisotropies in the cosmic microwave background radiation’s temperature and polarization. His work at NIST focuses on the operation of superconducting x-ray and gamma-ray sensors and analysis of their data to achieve optimal energy resolution, as well as x-ray metrology research and x-ray computed tomography. Felix H. Kim is a mechanical engineer with 11 years of experience in the NIST Intelligent Systems Division, specializing in laboratory x-ray, synchrotron, and neutron computed tomography for advanced materials analysis. He holds a B.S. and Ph.D. in civil engineering from the University of Tennessee, Knoxville, and an M.S. in structural engineering from the Georgia Institute of Technology. His research spans granular, carbon fiber composite, and metal additive as well as semiconductor manufacturing, and he is currently developing reference artifacts with engineered defects created using nanofabrication methods and reference datasets with ground-truth information to advance nondestructive defect detection in semiconductor packaging. Zachary H. Levine holds a Ph.D. in physics from the University of Pennsylvania. He joined NIST in 1994. He became a Fellow of the American Physical Society based on his foundational 1999 work in x-ray tomography of integrated circuit wiring. He has been on the hybrid electron-x-ray microscope project for the last seven years. John Henry Scott has been a physicist at NIST since 1997, and currently works in the Materials Measurement Science Division on the quantitative determination of elemental abundances at the micrometer scale and below. He is a past President and Fellow of the Microanalysis Society and the recipient of two Bronze Medal Awards and two Gold Medal Awards from the U.S. Dept. of Commerce. Paul Szypryt is a physicist with the National Institute of Standards and Technology and the University of Colorado Boulder. He is developing quantum sensor technologies, such as the transition-edge sensor (TES), kinetic inductance current sensor, and kinetic inductance detector. He has previously applied TES-based calorimeters for novel microcircuit tomography instrumentation.
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