edfas.org 31 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 3 Chair Chuan Zhang from Nvidia, the program delivers a well-balanced mix of academic research, industry case studies, and forward-looking developments that reflect both the current state and future direction of the field. A major highlight of ISTFA 2026 will be the EDFAS International Roadmap for Failure Analysis (IRFA), which will play a central role in the conference program. As our industry confronts increasingly complex technologies, the need for a coordinated, forward-looking roadmap has never been more critical. To support this effort, ISTFA will host a 90-minute opening plenary session dedicated to presenting the latest IRFA updates and outlining how failure analysis capabilities must evolve across tools, methodologies, and infrastructure in the coming years. Building on this foundation, attendees will also participate in three focused 30-minute breakout sessions designed to foster active discussion, share diverse perspectives, and identify emerging gaps and priority areas for development. By bringing together experts from industry, academia, and the supplier ecosystem, these IRFA activities will help define actionable next steps and ensure the roadmap reflects the collective voice of the community. We are honored to welcome Jeff Rearick, Senior Fellow at AMD and a globally recognized leader in design-fortest (DFT), as the ISTFA 2026 keynote speaker. Rearick’s work has long emphasized the importance of designing systems for observability and diagnosability, making his perspective especially relevant to this year’s theme. His keynote will explore the intersection of DFT and failure analysis, highlighting how intentional design decisions can dramatically improve debug efficiency, reduce time-to-root-cause, and enable faster product learning cycles. A key feature of this year’s program will be an interactive panel discussion focused on “Design for Analysis.” This session will bring together experts from industry and academia to explore practical strategies for making failure analysis faster, easier, and more effective. Topics will include design approaches that improve observability, integration of DFT features that enhance diagnosability, and San Antonio Botanical Garden. The San Antonio River Walk.
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