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37 ADVANCED MATERIALS & PROCESSES • SEPTEMBER 2014
Exhibition
MS&T14 brings together professionals from nearly
every field of materials science: Metals, polymers, ceramics,
and composites. Many industries are represented includ-
ing automotive, aerospace, instrumentation, medical, oil-
field, and energy. The exhibition at MS&T14 is a great
opportunity to reach potential customers from all markets
in a single venue.
Exhibitor Booth
ACERS 106
Accutek Testing
Laboratory 325
AdValue Technology LLC 405
Agilent Technologies 201
AIST 102
AK Steel T8
Aldrich Materials Science 211
Alfred University 317
Allied High Tech
Products Inc. 415
American Stress
Technologies Inc. 502
Angstrom Scientific Inc. 326
Applied Test Systems Inc. 414
ArcelorMittal USA T11
ASM 104
ASM 218
Beckman Coulter Life
Sciences 410
Binder Inc. 217
Boise State University Materials
Science & Engineering 214
Buehler 509
California Nanotechnologies
Inc. 324
Carl Zeiss Microscopy LLC 401
Centorr Vacuum
Industries Inc. 432
Ceramics Expo 624
Clemex Technologies 425
CM Furnaces Inc. 433
CompuTherm LLC 604
DTE Energy T7
EA Fischione
Instruments Inc. 205
Ebatco 319
EDAX Inc. 614
Electron Microscopy
Sciences 310
EMSL Analytical Inc. 209
Extrel 615
FEI Co. 300
Gasbarre Products Inc. 505
Goodfellow Corp. 538
Granta Design 304
GT Advanced
Technologies 529
Harper International 602
Hitachi High
Technologies America
Inc. 318
HORIBA Scientific 428
Hysitron Inc. 514
International Centre
for Diffraction Data 616
JEOL USA Inc. 501
Kurt J. Lesker Co. 408
Lapmaster International
LLC 526
Exhibitor Booth
LECO Corp. 400
Leica Microsystems 424
Maney Publishing 621
Metal Samples Co. 601
Metcut Research Inc. 508
Micromeritics Instruments
Corp. 301
MTI Corp. 420
MTS Systems Corp. 337
NACE 100
Nanovea 224
Netzsch Instruments
North America LLC 500
Newport Corp. 220
nGimat 429
NIST 609
NSL Analytical Services
Inc. 620
Object Research Systems
(ORS) Inc. 315
Ocean Optics 524
Olympus 225
Orton Ceramic
Foundation 226
Oxford Instruments 600
PANalytical 603
Powder Processing &
Technology 427
Proto Manufacturing 308
Renishaw (Canada) Ltd. 305
Rigaku Americas Corp. 625
Robocasting Enterprises
LLC 316
SAMCO Technologies Inc. 426
SaudiAramco 327
Sente Software Ltd. 510
Springer 515
SSAB Americas T12
Struers Inc. 409
TA Instruments 418
TEC 321
Tekscan Inc. 330
Tescan USA 516
Thermcraft Inc. 520
Thermo Fisher Scientific 525
Thermo-Calc Software 314
TMS 108
Tunable Materials Co. Ltd. 332
UES Inc. 303
Union Process Inc. 605
UNITRON 333
Verder Scientific
Carboltte 309
Westmoreland
Mechanical Testing &
Research Inc. 215
Wiley 416
Exhibitor List
*Exhibitor list current as of August 6.
Exhibition dates
and times*
Tuesday, October 14
Show hours: 11 a.m. – 6 p.m.
Lunch: 12 – 2 p.m.
Poster session: 2 – 6 p.m.
Happy hour reception: 4 – 6 p.m.
Wednesday, October 15
Show hours: 9 a.m. – 2 p.m.
Poster session: 9:30 – 10:30 a.m.
Lunch: 12 – 2 p.m.
*Times are subject to change
®
Hitachi High Technologies
America Inc.
Visit Hitachi High Technologies America Inc. (Booth 318)
to see the new SU5000 FE-SEM, equipped with Hitachi’s
groundbreaking computer-assisted technology, EM
Wizard, which offers a new level of SEMoperation and
control. Expert or novice, the result is now
the same: Highest quality nano-scale im-
ages at everyone’s fingertips!
• A novel, revolutionary user interface,
EMWizard, provides all users with
optimum levels of resolution,
repeatability,and throughput.
• Automatic axis adjustment technology
(auto-calibration) restores the
microscope to its “best condition” on
demand.
• Robust “draw-out” specimen chamber
accommodates large specimens
(~200 mmf, ~80 mmH).
• Rapid sample exchange; evacuation to
observation in 3 minutes or less.
Booth 318
JEOL USA Inc.
JEOL is a world leader in electron optical instrumentation
for scientific and industrial R&D. Core products include high
resolution electronmicroscopes for materials, failure analy-
sis, forensics, product inspection, nanotech, and semicon-
ductor applications: SEMs and FE-SEMs for observation/
analysis, TEMs for atomic-level imaging and high-speed
mapping, surface analyzers for materials characterization,
correlativemicroscopy solutions, specimen prep equipment,
and other analytical instruments. JEOL is also well known
for long-term applications and service expertise.
The development of new materials depends on a fun-
damental understanding of their structure, properties,
and the bonding between atoms. JEOL products are used
to characterize materials and offer state-of-the-art mi-
crostructural information.
What can we help you
achieve?
Booth 501