May_EDFA_Digital

edfas.org 47 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 Visit the Electronic Device Failure Analysis Society website edfas.org Contact Information ASM International 800.336.5152 MemberServiceCenter@asminternational.org asminternational.org CEI-Europe AB +46.13.100.730 eci@cei.se www.cei.se EMS Microscopy Academy 215.412.8400 info@emsdiasum.com emsmicroscopyacademy.com IEEE 732.562.3878 ieee-mce@ieee.org ieee.org IPFA +65.6743.2523 ieee_ipfa@singnet.com.sg ipfa-ieee.org Lehigh Microscopy School 610.758.5133 sharon.coe@lehigh.edu lehigh.edu/microscopy Materials Research Society (MRS) 724.779.3003 info@mrs.org mrs.org/61st-emc SEM-FIB Users Group contact@fibsem.net fibsem.net Semitracks Inc. 505.858.0454 info@semitracks.com semitracks.com SMTA 952.920.7682 smta@smta.org smta.org June 2019 (cont'd) EVENT DATE LOCATION International Conference for Electronics Enabling Technologies (ICEET) 6/4-6 Markham, Canada New Developments in Digital Computed Tomography (CT) for Nondestructive Failure Analysis of PCBAs and PCBFs 6/7 Richardson, TX eSMART Factory 6/20-21 Howell, MI SMTA/CALCE Symposium on Counterfeit Parts and Materials 6/25-27 College Park, MD Contact: SMTA Microscopy: The Complete Image 6/10-21 Hatfield, PA Contact: EMS Microscopy Academy 61st Electronic Materials Conference 6/26-28 Ann Arbor, MI Contact: MRS EVENT DATE LOCATION International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 7/2-5 Hangzhou, China Contact: IPFA Failure and Yield Analysis 7/8-11 Singapore Semiconductor Reliability and Product Qualification 7/15-18 Singapore Contact: Semitracks Inc. World Forum on 5G (WF-5G) 7/9-11 Santa Clara, CA Contact: IEEE Microscopy: The Complete Image 7/15-26 Hatfield, PA Contact: EMS Microscopy Academy July 2019