edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO.4 20 ACKNOWLEDGMENTS The author would like to acknowledge the following for their insights and technical expertise that made the success of this analysis possible: Arnulfo Evangelista, John Clark Arollado, and Ronnel Asistores for the extensive schematics and layout review; Danny Mariano for the die backside LEM support; and Elmer Pagkatipunan for the FIB cross-section and SEM support. The author would also like to acknowledge Erwin Oliva, Augusto Andal, and Ronel Dipalac for providing the support, guidance, and resources necessary for completing this work. SELECTED REFERENCES 1. “From Surface to Depth: How Accelerating Voltage Affects SEM Imaging,” Nanoscience Instruments, nanoscience.com/blogs/fromsurface-to-depth-how-accelerating-voltage-affects-sem-imaging. 2. “Why Use Low Accelerating Voltage for SEM Imaging?” Nano- science Instruments, nanoscience.com/blogs/why-use-low- accelerating-voltage-for-sem-imaging. Fig. 9 High versus low-acceleration voltage in SEM imaging. ABOUT THE AUTHOR Angelly Crisar Entice-Gomez received her bachelor’s degree in electronics engineering from Mindanao University of Science and Technology (now known as the University of Science and Technology of Southern Philippines) in Cagayan de Oro City in 2013. She joined Analog Devices Inc. in 2016 and is currently working as a senior failure analysis engineer for the industrial, power, and precision group in Analog Devices General Trias. NOTEWORTHY NEWS FIB SEM MEETING 2027 The 19th annual FIB SEM Meeting will be held March 23-24 at the Huang Engineering Center at Stanford University in Calif. The 2027 FIB SEM will feature presentations, tutorials, and posters by FIB users and vendors, highlighting new applications and the latest technology. The event offers plenty of technical content as well as opportunities for informal discussions with FIB colleagues. Continuing this year will be student awards for best oral and poster presentations. The abstract submission deadline is February 12, 2027. For more information, visit fibsem.net or email keana.scott@nist.gov.
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