edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 3 46 TRAINING CALENDAR LIFELONG LEARNING EDFAS believes in lifelong learning and supporting our members and customers in that endeavor. Our goal is to provide a list of educational resources in failure analysis and related topics in each issue of EDFA magazine. In addition, explore all EDFAS has to offer from regional events, chapter courses, and tutorials and courses during ISTFA. Find out more by visiting edfas.org. Rosalinda M. Ring, NenoVision jmj4papa@yahoo.com EVENT DATE LOCATION Microscopy and Microanalysis (M&M) 8/2-6 Milwaukee, WI Contact: M&M How to Organize and Run a Failure Investigation 8/3-5 Virtual Event Fractography 8/3-6 Novelty, OH Metallographic Techniques 8/10-13 Novelty, OH Principles of Failure Analysis 8/17-19 Virtual Event Advanced Metallographic Techniques 8/17-20 Novelty, OH Contact: ASM International Future of Memory and Storage 8/4-6 Santa Clara, CA Contact: FMS International Materials Research Congress 8/17-22 Cancun, Mexico Contact: IMRC Hot Interconnects 8/19-21 Virtual Event Contact: Hot Interconnects Hot Chips 8/23-25 Palo Alto, CA Contact: Hot Chips SPIE Optics + Photonics 8/23-27 San Diego, CA Contact: SPIE International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management 8/26-27 Shenzhen, China Contact: PCIM Asia International Conference on Defects Recognition, Imaging, and Physics 8/30-9/3 Warsaw, Poland Contact: DRIP International Microscopy Congress 8/30-9/4 Liverpool, UK Contact: IMC August 2026 EVENT DATE LOCATION SEMICON Taiwan 9/2-4 Taipei, Taiwan Contact: SEMICON Taiwan European Microwave Week 9/4-9 London, UK Contact: EuMW Conference on Electron Microscopy of Nanostructures 9/7-11 Belgrade, Serbia Contact: ELMINA EU-FIB.net Workshop 9/8-11 Marseille, France Contact: EU-FIB.net SPIE Photomask Technology + Extreme Ultraviolet Lithography 9/8-11 Monterey, CA Contact: SPIE Photomask Technology China International Optoelectronic Exposition 9/9-11 Shenzhen, China Contact: CIOE Scanning Electron Microscopy 9/11 Novelty, OH Principals of Failure Analysis 9/14-16 Novelty, OH Practical Fractography 9/28-29 Novelty, OH Contact: ASM International IC Packaging Technology 9/14-15 Phoenix, AZ Advanced CMOS/ FinFet Fabrication 9/21-22 Phoenix, AZ Contact: Semitracks LLC European Materials Research Society Fall Meeting 9/14-17 Warsaw, Poland Contact: E-MRS Energy Conversion Congress & Expo Europe 9/14-18 Valencia, Spain Contact: ECCE Europe September 2026
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