edfas.org 45 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 3 any of the installed V/I supplies. Furthermore, advanced algorithms ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards. A powerful, extraordinarily fast embedded VME controller drives the highest speed-of-test execution available. Data transfer between the embedded controller and the testers PC server, is handled through TCP/IP communication protocols, minimizing data transfer time. The testers PC server can be accessed through internal networks, as well as through the internet, allowing remote access to the system to determine the system’s status or to gather result information. The hybrid power supply enables advanced latch-up testing by addressing limitations for high current tests. Utilizing a hybrid model, the VI interface board controls an external power supply with analog signals, ensuring faster and more reliable communication than digital commands. This setup is crucial for controlling millisecond events and for enhancing system responsiveness and precision. The hybrid power supply supports up to 750 A per power module, with the flexibility to use up to seven modules simultaneously, meeting the demands of robust stress testing scenarios. For more information, visit thermofisher.com. ORAGE 2 Ga+ FIB-SEM FOR AUTOMATED TEM SAMPLE PREP Tescan has launched Orage 2, a next-generation Ga+ FIB-SEM column integrated into the AMBER 2 platform for advanced materials science applications. Designed to accelerate TEM sample preparation, cross-sectioning, and nanoscale characterization, Orage 2 combines marketleading low keV FIB resolution down to 500 eV with high beam current performance up to 100 nA. Together, these features enable up to 40% faster milling while maintaining the precision required for ultra-thin TEM lam- ella preparation. When paired with TEM AutoPrep Pro automation and the fully integrated Aura Gentle Ion Beam for low-energy argon polishing, the system delivers a complete, automated workflow for high-quality, reproducible TEM specimens. Final polishing has traditionally been the most delicate and operator-dependent step of TEM sample preparation. At low accelerating voltages, conventional Ga+ FIB systems often struggle with poor image clarity. Operators must interpret faint features and rely heavily on experience to avoid over-milling or damaging the lamella. With improved FIB resolution down to 500 eV, users gain clear visibility of the finest lamella details during the final thinning steps. This clarity enables precise beam placement and confident polishing of ultra-thin specimens while minimizing amorphous damage. The process becomes more controlled, more repeatable, and far less dependent on expert intuition. For more information, visit tescan.com. IMAGEIR 6300 Z INFRARED CAMERA For over ten years InfraTec has offered infrared cameras with motorized zoom, which can perform thermography on objects even over long distances. By using a teleextender, which is now also available for ImageIR 6300 Z, the range of the ImageIR 6300 Z camera can be increased by approximately 1.5 times. The minimum working distance required between the camera and the test object (minimum focusing distance) increases only slightly, which is particularly advantageous. With the ImageIR 6300 Z, InfraTec has taken a new approach to the development of zoom cameras: Thanks to a state-of-the-art SWaP-optimized detector and cooling technology, the system weight has been reduced to just 2 kg. The 15-115 mm motorized zoom lens used in the standard version, in combination with an MWIR detector, enables the detection of people at distances of over 6.1 km. With a teleextender, the ImageIR 6300 Z weighs only 2.5 kg and its overall length increases from 225.5 mm to just 259 mm. With the focal length extended to 170 mm, it is possible to detect people at a distance of up to 8.2 km. Another key benefit of the ImageIR 6300 Z’s teleextender is that it can be mounted and removed by the user since it simply screws onto the lens. This significantly expands the range of practical applications. For more information, visit infratec-infrared.com. Tescan Orage 2 column as installed on a Solaris FIB-SEM. InfraTec ImageIR 6300 Z with teleextender long-range lens.
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