edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 3 42 LITERATURE REVIEW The current column comprises peer-reviewed articles published since 2021 on microscopy, optical fault isolation, security, photonics, solar cells, photovoltaics, and light emitting diodes (LEDs), among other topics. Optical methods and techniques are fundamental to nondestructive analysis of modern integrated circuits. Note that inclusion in the list does not vouch for the article’s quality and category sorting is by no means strict. If you wish to share an interesting, recently published peer-reviewed article with the community, please forward the citation to the email address listed above and I will try to include it in future installments. Entries are listed in alphabetical order by first author, then title, journal, year, volume, and first page. Note that in some cases bracketed text is inserted into the title to provide clarity about the article subject. Peer Reviewed Literature of Interest to Failure Analysis: Optics, Optical Techniques and Fault Isolation, Security, Photonics, Solar, Photovoltaics, and LEDs. Michael R. Bruce, Consultant mike.bruce@earthlink.net • W. Chen, et al.: “Enabling Highly Efficient Infrared Silicon Photodetectors via Disordered Metasurfaces with Upconversion Nanoparticles,” Sci. Adv., 2025, 11, p. eadx7783, doi.org/10.1126/ sciadv.adx7783. • J.Y. Chia, et al.: “Machine Learning-Enhanced Detection of Minor Radiation-Induced Defects in Semiconductor Materials using Raman Spectroscopy,” J. Appl. Phys., 2024, 135, p. 025701, doi.org/10.1063/5.0179881. • H. Defienne, et al.: “[Review:] Advances in Quantum Imaging,” Nat. Photon., 2024, 18, p. 1024, doi.org/10.1038/s41566-024-01516-w. • C. He, et al.: “Soft Fault Localization on CMOS Differential Circuit using Dynamic Analysis by Laser Stimulation,” Microelectronics Reliability, 2025, 175, p. 115917, doi.org/10.1016/j.microrel. 2025.115917. • J. Hwang and W. Jhe: “[Review:] Advanced Progress on Tip-Enhanced Raman Spectroscopy and Its Applications,” Jpn. J. Appl. Phys., 2025, 64, p. 040801, doi.org/10.35848/1347-4065/adc268. • T. Krachenfels, et al.: “Trojan Awakener: Detecting Dormant Malicious Hardware using Laser Logic State Imaging (Extended Version),” J Cryptogr Eng., 2023, 13, p. 485, doi.org/10.1007/s13389- 023-00323-3. • H. Li, et al.: “Near-Infrared Confocal Laser Scanning Microscope System with InGaAs Focal Plane Array [for Flip-Chip Defect Analysis],” Meas. Sci. Technol., 2025, 36, p. 035202, doi.org/ 10.1088/1361-6501/ada81e. • W. Liao, et al.: “Study on Rapid Degradation and Failure Mechanisms of GaN-Based Blue Laser Diodes,” Microelectronics Reliability, 2025, 174, p. 115901, doi.org/10.1016/j.microrel.2025.115901. • L. Ma, et al.: “Real-Time [Laser Scan] Imaging of Electromagnetic Fields [in Si],” Opt. Express, 2022, 30, p. 20431, doi.org/10.1364/OE.461137. • K. Maarouf, et al.: “Fatigue Damage of Automotive LEDs: Experimental Approach and Thermomechanical Model,” Microelectronics Reliability, 2025, 171, p. 115799, doi.org/10.1016/ j.microrel.2025.115799. • N. Margalit, et al.: “Perspective on the Future of Silicon Photonics and Electronics,” Appl. Phys. Lett., 2021, 118, p. 220501, doi.org/10.1063/5.0050117. • M. Maziuk, et al.: “Imaging Methods of Detecting Defects in Photovoltaic Solar Cells and Modules: A Survey,” Metrol. Meas. Syst., 2023, 30, p. 381, doi. org/10.24425/mms.2023.146426. • N. Mebarki, et al.: “An Integrated Physical Model and Extant Data Based Approach for Fault Diagnosis and Failure Prognosis: Application to a Photovoltaic Module,” Microelectronics Reliability, 2025, 168, p. 115711, doi.org/10.1016/j.microrel. 2025.115711. • A.A. Merassi and T. Melis: “Laser Voltage Probing and Simulation of a Flip-Flop with Undesired Quasi-Static Switching,” Microelectronics Reliability, 2025, 167, p. 115637, doi.org/10.1016/j.microrel. 2025.115637. • A. Nikolskaya, et al.: “Thermally Stable Photoluminescence Centers at 1240 nm in Silicon
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