edfas.org 43 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 2 E-LIT POWERS THERMOGRAPHIC FAULT ISOLATION ON CHIPS AND POWER MODULES STMicroelectronics manufactures a wide array of semiconductor devices and their products are mainly used in the automotive industry and for the internet of things. The company performs nondestructive fault isolation on chips, discrete components, sensors, LEDs, and power modules using InfraTec’s E-LIT system at their sites in Shenzhen, China and Calamba, Philippines. The E-LIT solution uses lock-in thermography (LIT) as its method. This involves selectively applying time-gated electrical excitation to electronic components or assemblies to detect and analyze local faults based on thermal anomalies. During electrical activation of components under investigation, changes in surface temperature are measured using a high-end infrared camera from the ImageIR series to identify so-called “hot spots.” This allows even the smallest defects, such as defects which cause tiny temperature deviations in the mK to µK range, to be detected. The test system, composed of an excitation source, an infrared camera with adjustable Z-axis positioning and additional accessories, was integrated into the failure analysis laboratory. For the analysis of large components, the E-LIT system is equipped with 25 mm lenses that PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG MW640-15 MWIR CAMERA FOR MICROSCOPIC THERMAL IMAGING Optotherm Inc. released the MW640-15, a high-sensitivity MWIR thermal imaging camera designed for front and backside IC failure analysis, lock-in thermography, and microscopic temperature measurement. Unlike standard MWIR imaging systems, the MW64015 features NETD <20 mK sensitivity, reducing lock-in thermography test time, while its high spatial resolution enables discrimination of IC features down to 1 µm. The camera includes a 640 × 512 15 µm pitch HgCdTe (MCT) detector cooled to 80 K using a Stirling engine. Frame rates of 115 Hz (full frame) and 1550 Hz (windowed) allow analysis of thermal behavior in active IC devices. The InfraTec E-LIT automated lock-in thermography system. Applications include hot spot detection <0.0001°C, junction temperature measurement, and semiconductor device transient analysis. The MW640-15 can be used standalone or integrated into a turnkey Optotherm Sentris system. “We developed the MW640-15 for failure analysis engineers who require high spatial resolution and measurement sensitivity, and the ability to perform IC backside analysis,” says Rich Barton, president and technical director at Optotherm Inc. Sentris is Optotherm’s product line of infrared imaging systems. For more information, visit optotherm.com. The MW640-15 is Optotherm’s most sensitive thermal imaging camera.
RkJQdWJsaXNoZXIy MTYyMzk3NQ==