edfas.org 11 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 2 NOTEWORTHY NEWS MICROSCOPY & MICROANALYSIS MEETING 2026 The Microscopy & Microanalysis (M&M) 2026 meeting will be held August 2-6 in Milwaukee. The scientific program features the latest advances in biological, physical, and analytical sciences as well as techniques and instrumentation. Complementing the program is one of the largest exhibitions of microscopy and microanalysis instrumentation and resources in the world. Educational opportunities include a variety of Sunday short courses, tutorials, workshops, and pre-meeting congresses for early-career scientists. M&M is sponsored by the Microscopy Society of America, the Microanalysis Society, and the Microscopical Society of Canada. For more information, visit mmconference.microscopy.org. CAM-WORKSHOP 2026 The 13th CAM-Workshop on Failure Analysis and Material Diagnostics for Electronic Components will take place on May 19-20 in Halle, Germany. The CAM-Workshop brings together experts from the electronics industry and materials diagnostics equipment manufacturers. The goal of the event is to discuss challenges and future requirements in the field of failure analysis and materials characterization of electronic devices, sensors, and systems. The event includes oral presentations as well as an industrial exhibition. For more information, visit cam-workshop.de.
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