edfas.org 39 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 1 2025 EDFAS AWARD WINNERS EDFAS AWARD WINNERS: RECOGNIZING INDUSTRY PIONEERS AND LEADERS Felix Beaudoin, FASM, Chair, EDFAS Awards and Nominations Committee Immediate Past President, EDFAS felix.beaudoin@globalfoundries.com The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. I am pleased to highlight the 2025 winners. The EDFAS Lifetime Achievement Award recognizes those who have given their time, knowledge, and abili- ties toward the advancement of the electronic device failure analysis industry. The 2025 awardee is Dr. David Hung-I Su, retired, previous director of failure analysis, Taiwan Semiconductor Manufacturing Co. (TSMC) and adjunct professor department of engineering and systems science, National Tsing Hua University, Taiwan. His citation reads: “For his work on the adoption of FIB and TEM techniques in volume manufacturing, his outstanding contribution to EDFAS, and his advocacy of failure analysis in Asia and North America.” professor in the department of engineering and system science of the National Tsing-Hua University in Taiwan and an independent consultant. Prior to joining TSMC, he was director of TEM and FIB technology development at Accurel Systems in Sunnyvale, Calif. (1998-2000). From 1991 to 1998 he was TEM specialist at the materials analysis group of Philips Semiconductors in Sunnyvale, Calif. He was an adjunct professor at the department of materials engineering at San Jose State University from 1989 to 1991. David received his B.S. degree in chemical engineering from the University of São Paulo, Brazil, and his M.S. and Ph. D. degrees in chemical engineering from Stanford University. He has been a board member of the Taiwan Microscopy Society since 2004. He was a board member of the Electronic Device and Failure Analysis Society (2014-2016) and chair of the Sematech IntegratedCircuit Failure Analysis Council (2013). He was chairman of the 2010 IRPS Failure Analysis Technical Program and was International Chair for ISTFA 2010 and 2011 and International Co-Chair in 2013. The EDFAS President’s Award recognizes those who provided an exceptional amount of effort in their service to the Society. The 2025 awardee, Susan Li, technical director, Marvell Technology, Santa Clara, Calif. Her citation reads: “In recognition of her decades of leadership, mentorship, and tireless advocacy, which have inspired widespread engagement and significantly advanced both the EDFAS community and the electronic device failure analysis field.” Susan Li is a technical director at Marvell Technology. She is currently working on tools and techniques development to support failures analysis on IC devices using leading edge technology nodes and advanced 2.5D and 3D SiP packaging. During her long tenure with AMD/ Spansion/Cypress/Infineon, she worked on multiple different products including microprocessor, networking, flash memory, SRAM, and recently MCU, Type-C USB and David Su receives the 2025 EDFAS Lifetime Achievement Award. David Su was director of the failure analysis division of TSMC in charge of reliability-related failure analysis, materials and surface analysis including TEM, and chemical analysis from 2000 until 2018. He is currently adjunct
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