edfas.org 13 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 1 Veronika Hegrová is the head of applications at NenoVision company, with extensive experience with AFM-in-SEM. She studied physical engineering and nanotechnology at BUT (Czech Republic) and JKU Linz (Austria), where she continued her work on fabrication and characterization of lowdimensional heterostructures. She is interested in high-tech products, their functionalities, and innovations that help to improve sample characterization. Hegrová has co-authored more than 10 scientific papers and is especially interested in correlative material characterization, which speeds up sample characterization and allows users to better understand complex sample features. Rosalinda Ring is the director of applications and engineering at NenoVision. She has over 25 years of semiconductor experience, working for AMD, Intel, GlobalFoundries, Motorola, and others. Ring is an associate editor of EDFA magazine, a member of the International FA Technology Roadmap Council, and serves on the EDFAS Board of Directors. She holds 47 patents on various FA-related subjects including Ga probe, FIB/SEM GIS, circuit edit, and an EBIC endpointing mechanism. Jan Neuman is the CEO and cofounder of NenoVision, a deep-tech company started in 2015 as a spin-off of CEITEC in Brno, Czech Republic. He earned his Ph.D. in physical and materials engineering from Brno University of Technology, specializing in the fabrication and characterization of nanostructures. During his doctoral research, he contributed to the development of an AFM model for UHV SEM and spent five months as a visiting Ph.D. student at the Weizmann Institute of Science in Israel. His long-standing interest in correlative microscopy led to the commercialization of AFM-in-SEM technology at NenoVision. In recent years, Neuman has focused on applying AFM-in-SEM to current and future challenges in semiconductor failure analysis and regularly presents related results and tutorials at the ISTFA conference.
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