edfas.org 45 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 4 ABOUT THE COVER All images are from the 2024 EDFAS Photo Contest. Images and captions have been edited from original submitted entries. Top left: The Four Musketeers. Pioneering diamond-coated self-sensing AFM probes were photographed while inspecting defects. The picture is a collage arranged to form the famous “All for one, one for all” stance. Photo by Jan Neuman, NenoVision, Second Place Winner, Color Images. Bottom left: The image captured from decapsulating the device showed bond wires that look like beading eyes of an owl and the EOS damage appearing to have its mouth open as if it’s in shock and stressed. Photo by Allen Gabat, Raytheon Intelligence & Space, Third Place Winner, Color Images. Top middle: FIB cross-sectional view looks like a cute little terrier dog treasure hunting in a ditch. Photo by Susan Li, Yeow Shen Goh, and Ming Zhang, Infineon Technologies, Second Place Winner, Black and White Images. Top right: Bipolar Lighthouse: A nanoprobing tip reaches down onto an M0 contact on a lamella of a 5-nm device. The red and blue contrasts highlight the electron beam induced current responses from both the NW and PW depletion zones associated with the device. Photo by Greg Johnson, Zeiss Microscopy, and Andreas Rummel, Kleindiek Nanotechnik, Second Place Winner, False Color. Right middle: Bond wire in a large IGBT module that failed during high current testing. Note that the bond wire is not melted, but aluminum has moved on to the die surface from electromigration. Photo by Mark Gores, Hi-Rel Laboratories Inc., Third Place Winner, Black and White Images. Bottom right: Whack-a-NAND. AFM tip observed in SEM while mapping the conductivity on a cross-section of a 3D NAND gate. The current map was overlayed in post-processing. Photo by Jan Neuman, NenoVision, Third Place Winner, False Color Images. critical challenges such as dopant clustering and diffusion, grain boundary segregation, hydrogen embrittlement, and geological and isotopic analysis. For anyone new to APT and/or looking to understand its relevance in semiconductor R&D, this tutorial provides both the basics and highlights real-world use cases. Katherine Rice is the applications and market development manager at CAMECA Instruments, based in Madison, Wis. She holds a Ph.D. in chemical engineering from the University of Colorado Boulder and an MBA in Marketing from the University of Wisconsin–Whitewater. For additional information on the EDFAS Education Subcommittee, contact Navid Asadi at nasadi@ufl.edu.
RkJQdWJsaXNoZXIy MTYyMzk3NQ==