edfas.org 41 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 4 ure analysis science and indispensable to our industry’s future. Vinod Narang is a seasoned semi- conductor failure analysis expert with over 20 years of deep experience in the field. He currently serves as the Senior Engineering Manager at the Device Analysis Lab at AMD Singapore, a position he has held since 2005. In this role, Narang leads AMD’s physical failure analysis team, supporting the company’s worldwide failure analysis needs. His prior work experience was with Micron, Singapore, as DRAM failure analysis shift engineer. He has pioneered the implementation of numerous novel techniques and developed strong relationships with vendors, foundries, universities, and research institutes. Under Narang’s leadership, AMD’s Device Analysis Lab has quadrupled in size, attracting and retaining high-caliber talent. His strategic initiatives have improved analysis success rates and resolved critical silicon issues, significantly impacting AMD’s bottom line. Throughout his career, Narang has made significant contributions to the industry. He has published over 30 technical papers, delivered five invited talks, and hosted a webinar. Narang has held key leadership roles within the IEEE’s sponsored IPFA Conference, including serving as the Conference Chair in 2016 and Board Member since 2017. He is serving as IEEE’s Singapore Electron Devices/ Reliability Society/Electronics Chapter Executive committee member since 2015. He has contributed to the ISTFA Organizing Committees in various capacities such as International Chair, Co-University Chair & Roadmap Chair. He’s mentoring high school students for engineering innovation challenge conducted by Institution of Engineers Singapore since 2020. Vision Statement Narang proposes an ambitious five-year strategic plan for EDFAS, aimed at accelerating the organization’s growth in line with the rising stature of the semiconductor and electronics industry. His vision includes enhancing member value through mentorship opportunities and fostering wider collaboration. Developing a robust structure to connect scientific equipment suppliers, industry, academia, and research institutes will be a key focus. He aims to grow membership by engaging younger engineers and students through social media and technical channels. Additionally, he envisions establishing EDFAS as a worldwide resource for microelectronics failure analysis, leveraging hybrid conference formats and deepening collaboration with the Asian and European FA communities. His vision for the FA Technical Roadmap committee is to be the leading authority and driving force in identifying and addressing the evolving challenges and gaps in failure analysis. Through these initiatives, elevate EDFAS as a global leading professional society in our field. Mrunal Shah is a yield engineer at GlobalFoundries in Malta, N.Y., where he focuses on advancing semiconductor technology nodes at 45 nm and below. His work centers on driving yield improvement and product performance through data analysis, root-cause investigations, and failure analysis. He holds an M.S. in electrical engineering and Ph.D. in applied economics from Purdue University and a B.Tech. in computer engineering. During his graduate research, he led international field studies on technology adoption and conducted projects in advanced materials and semiconductor device development. His diverse aca- demic background blends technical innovation with economic and industrial insight, giving him a unique perspective on semiconductor markets and manufacturing. Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis: KJ Johanns, Business Development Manager 440.671.3851, kj.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/advertise.
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