edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 4 40 BOARD CANDIDATE PROFILES PROFILES OF CANDIDATES FOR THE EDFAS BOARD OF DIRECTORS Felix Beaudoin FASM, Chair, EDFAS Awards & Nominations Committee felix.beaudoin@globalfoundries.com The EDFAS Board of Directors unanimously approved one reappointed and one new member with terms beginning in 2025. Members-At-Large 2025-2028 • Bhanu Sood • Vinod Narang Student and Young Professional Board Member 20252026 for a one-year term is Mrunal Shah. Congratulations to all. Bhanu Sood received bachelor’s and master’s degrees in mechanical engineering and metallurgy from the National Technical University of Ukraine, Kiev Polytechnic Institute, and a Ph.D. from the University of Maryland. In an engineering career spanning twenty-five years, he has worked with diverse teams in management, technology development, and engineering capacities. Sood has developed electronics systems and led failure analysis, reliability evaluations, and risk assessments for space, avionics, military, automotive, medical, and telecommunication industries. Currently, as the Center Chief Technologist at NASA’s Goddard Space Flight Center in Greenbelt, Maryland, he leads technology strategy, program execution, and resource planning while championing mission infusion in space domain strategic areas. Previously, as Chief Engineer for Quality and Reliability, he led NASAwide review boards and failure investigation teams. He has authored numerous articles and book chapters and has given lectures on analytical technology challenges in both micro- and nanoelectronics. He is currently a member of the EDFAS Board where he leads efforts focused on the identification of electronics failure analysis education delivery mechanisms and the development of education programs for the Society. Sood remains an active contributor to industry volunteer consensus standards activities associated with failure analysis, electronics reliability, quality, and supply chain within SAE, IPC, and IEEE. Vision statement EDFAS stands at the forefront of advancing failure analysis science in an era where microelectronics are growing increasingly complex and global supply chains become more interconnected. As technological and business challenges continue to impact innovation in FA labs, our vision is to empower analysts to deliver results with unprecedented speed, accuracy, and efficiency. We envision a future where digitized educational resources—including short courses and tutorials developed by industry leaders—reach a wider audience, providing continuous learning opportunities between ISTFA conferences. Central to our vision is exploring formal certification pathways for electronics failure analysts, creating industry-recognized credentials that align with established standards in test, NDE, and metrology fields. This certification framework will enhance our members’ professional standing and marketability while clarifying their specialized expertise. Through these strategic initiatives, EDFAS will strengthen its position as an essential resource for current practitioners while attracting new generations of failure analysis professionals. Our commitment to excellence in education, certification, and professional development will ensure that EDFAS remains vital to the advancement of fail-
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