edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 4 30 28. S. Es, et al.: “RAGAs: Automated Evaluation of Retrieval Augmented Generation,” EACL: System Demonstrations, 2024, p. 150-158. 29. A. Safont-Andreu, C. Burmer, and K. Schekotihin: “Using Ontologies in Failure Analysis,” Proc. ISTFA, 2021, p. 23-28. 30. A. Dobrovsky, K. Schekotihin, and C. Burmer: “Managing Complex Failure Analysis Workflows with LLM-based Reasoning and Acting Agents,” 2025, arxiv.org/html/2506.15567v1. TOWARD A FAILURE ANALYSIS CHATBOT WITH RETRIEVAL-AUGMENTED GENERATION(continued from page 27) ABOUT THE AUTHORS Maik Fichtenkamm completed his master’s degree in artificial intelligence and cybersecurity at Alpen-Adria University Klagenfurt. He previously earned a bachelor’s degree in international business administration and information technology from Hochschule Ludwigshafen. During his studies, he gained practical experience at BASF as a dual student, including an internship in AI solutions. At Infineon Technologies, he worked in cyber defense threat intelligence and currently focuses on failure analysis. His academic and professional background reflects a strong interest in the intersection of AI, cybersecurity, and industrial applications. Markus Kofler completed five years of education in network technology at the Higher Technical College (HTL) in Villach. Afterwards, he pursued a bachelor’s and master’s degree in information management. Alongside his studies, he began working full-time at Infineon Technologies, where he has now been employed for seven years. His professional focus lies in software development, cloud technologies, and generative AI. Konstantin Schekotihin is a professor of intelligent systems at the University of Klagenfurt in Austria. His research primarily focuses on various aspects of semantic systems, which include knowledge representation and reasoning, machine learning for computer vision and natural language processing, as well as knowledge acquisition and maintenance. He also explores logic programming and reasoning techniques. Schekotihin has authored over 70 papers that have been published in prestigious AI conferences and leading international journals. Christian Burmer joined Siemens Corp. in 1986, where he developed laserbased methods and tools for micromanipulation in semiconductor devices. Since 1992, he has been working in the failure analysis department at Infineon Technologies. His focus is on localization strategies for logic and mixed-signal designs. He has authored and co-authored several papers on software-based fault localization and related topics. Burmer has also conducted tutorials on fault localization, both internally at his company and during the ETS and GMM symposia. He is actively involved in projects that develop software applications for failure analysis, specifically concentrating on extracting information using AI methods.
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