August 2025_EDFA_Digital

edfas.org 47 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 3 EVENT DATE LOCATION SEMICON West 10/7-9 Phoenix, AZ Contact: SEMICON West International Semiconductor Conference (CAS) 10/7-11 Sinaia, Romania Contact: CAS Women in Electron Microscopy—Breaking Barriers and Building Networks 10/8-10 Jülich, Germany Contact: WEM SMTA International Conference and Exposition 10/19-23 Rosemont, IL Contact: SMTA October 2025 Check organizers’ websites for the most up-to-date information. MCM Slovene Society for Microscopy info@mikroskopsko-drustvo.si 17mcm.si Microelectronics UK enquiries@microelectronicsuk.com microelectronicsuk.com Microscopy Conference microscopy-conference.de MIC Symposium Microscopy Imaging Center mic.unibe.ch/events/mic_symposium_2025_multi_ scale_imaging_across_modalities MRS Materials Research Society mrs.org/meetings-events/annual-meetings PCIM Asia pcimasia@china.messefrankfurt.com pcimasia-shanghai.cn.messefrankfurt.com/shanghai/ en.html SEMICON +447520604066 semiconforum@nexusforums.net nexusforums.net/2025/semiconductors SEMICON WEST semiconwest@semi.org semiconwest.org Semitracks 505.858.0454 info@semitracks.com semitracks.com/company/contact-us.php SMTA 952.920.7682 smta@smta.org smta.org/events WEM er-c.org/index.php/conferences/wem Contact Information ASM International 440.338.5151 memberservicecenter@asminternational.org asminternational.org CAS cas@imt.ro imt.ro/cas CIOE cioe@cioe.cn cioe.cn/en ECOC ecoc2025@cap-partner.eu ecoc2025.org ECSIA +420.602.894.247 info@conforg.cz ecsia2025.karlin.mff.cuni.cz/organizers.html EMK/MSC 0212.381.46.00 microscopycongress2025@gmail.com temdcongress25.org.tr/?p=contact EuMW eumwreg@itnint.com eumweek.com EU PVSEC pv.conference@wip-munich.de eupvsec.org ICSCRM icscrm2025@benepeople.co.kr icscrm2025.org IPFA +60.46535611 ipfasecretariat@usm.my ipfaieee.org/2025 IWUMD iwumd2025@pwr.edu.pl iwumd2025.pwr.edu.pl November 2025 EVENT DATE LOCATION Principles of Failure Analysis 11/10-13 Novelty, OH International Symposium for Testing and Failure Analysis (ISTFA) 11/16-20 Pasadena, CA Contact: ASM International SEMICON 11/13-15 Dubai, UAE Contact: SEMICON MIC Symposium: MultiScale Imaging Across Modalities 11/14 Bern, Switzerland Contact: MIC Symposium Materials Research Society Fall Meeting and Exhibit 11/3012/5 Boston, MA Contact: MRS

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