edfas.org 27 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 3 Novolac Resin and Evaluation of Its Combinational Effects,” Materials, 2019, 12, 1528. 10. K. Das, J.B. Freund, and H.T. Johnson: “Mechanisms of Material Removal and Mass Transport in Focused Ion Beam Nanopore Formation,” J. Appl. Phys., 2015, 117, p. 085304-1–085304-16. 11. K. Das, J.B. Freund, and H.T. Johnson: “Erosive-thermal Transition in High-flux Focused Ion Beam Nanomachining of Surfaces,” Extreme Mechanics Letters, 2016, 7, p. 121-125. 12. J.R. Michael, et al.: “Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Indium,” Microscopy and Microanalysis, 2022, 28, p. 603-610. 13. Powerstream URL, accessed 12/2024: https://www.powerstream. com/vapor-pressure.htm. ABOUT THE AUTHORS Bill Mook is a Senior Member of the Technical Staff at Sandia National Laboratories (2018-current) in the Microelectronics Failure Analysis Department. Prior to Sandia, he had two postdocs, the first was at EMPA (Swiss National Lab for Materials Science) in Thun, Switzerland, and the second was at the Center for Integrated Nanotechnologies, Los Alamos National Laboratory. He obtained a bachelor’s in materials science from the University of Michigan, a master’s and a Ph.D. both in materials science from the University of Minnesota where his Ph.D. thesis work focused on experimental nanomechanics. Dustin Ellis is a Principal Member of the Technical Staff at Sandia National Laboratories (2021 to present) in the Materials Analysis Department. Prior to Sandia, he was a Staff Applications Scientist at Thermo Fisher Scientific and a Lead Materials Scientist at GE Global Research. He has a bachelor’s in metallurgical engineering from SD School of Mines and Technology and a master’s in materials science from Rensselaer Polytechnic Institute.
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