May 2025_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 2 44 Allied High Tech................................................22-23 ASM International....................................................3 Checkpoint Technologies.................................14-15 SEMICAPS......................................Inside front cover Ted Pella.................................................................13 ULTRA TEC................................................Back cover For advertising information and rates, contact: KJ Johanns, Business Development Manager 440.671.3851, kj.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/advertise. INDEX OF ADVERTISERS A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS Whether networking at events or accessing information through EDFA, ISTFA proceedings, or journals, our members have the edge. Now it’s time to introduce EDFAS to others in the industry who would like to take advantage of these career-enhancing benefits. Help us help the industry by expanding our membership and offering others the same exceptional access to information and networking that sets EDFAS apart. To reacquaint yourself with and introduce others to the EDFAS member benefits, visit asminternational.org/edfas/membership. EDFAS MEMBERSHIP Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis: KJ Johanns, Business Development Manager 440.671.3851, kj.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/advertise. NOTEWORTHY NEWS IEDM 2025 The 71st International Electron Devices Meeting (IEDM) will be held December 6-10 at the Hilton San Francisco Union Square. IEDM is a leading forum for reporting breakthroughs in the technology, design, manufacturing, physics, and modeling of semiconductors and other electronic devices. Topics of interest include circuit and device interactions; characterization, reliability, and yield; compound semiconductor and high-speed devices; memory technology; modeling and simulation; nano device technology; optoelectronics, displays, and imagers; power devices, process and manufacturing technology, and sensors, MEMS, and BioMEMS. IEDM is sponsored by the IEEE Electron Devices Society. For more information, visit ieee-iedm.org and watch for any updates to the meeting plan.

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