A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS FEBRUARY 2025 | VOLUME 27 | ISSUE 1 ELECTRONIC DEVICE FAILURE ANALYSIS edfas.org BACKSIDE DELAYERING OF 10 nm NODE ICs QUANTUM DIAMOND MICROSCOPY FOR FAILURE ANALYSIS HIGHLIGHTS FROM ISTFA 2024 LOW FREQUENCY NOISE SPECTROSCOPY 3 18 8 28
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