edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 1 44 talks, a panel discussion, and two keynote speeches (one for the technical conference and one for the FA Technology Roadmap session). The technical conference keynote speech, “Quality, Reliability, and Failure Analysis for Generative AI” from Dr. James Chambers (Vice President, Nvidia), FA Technology Roadmap keynote speech, “Vision of NIST and Government Funding Opportunities in Fault Isolation and Failure Analysis Field” coupled with an FA Technology Roadmap vendor panel discussion and an AI specific panel discussion helped round off a very packed and technically exciting conference. ISTFA 2025 will be held in Pasadena, November 16 through 20. The General Chair, Renee Parente, announced that the conference theme will be “Scaling Beyond Moore’s Law: Heterogenous Computing and Advanced Packaging.” Ted Kolasa was unanimously approved by the Board to serve as the Technical Program Chair. Felix Beaudoin, the Awards and Nominating Committee chair, announced multiple awards: the 2024 President’s Award to Erfat Moyal, and the 2024 Lifetime Achievement Award, posthumously presented to Dr. Ted Lundquist. This year, EDFAS was also honored with two new ASM Fellows—Dr. Zhigang Song and Ryan Ross. Additionally, Keith Serrels was awarded an ASM Silver Medal for his leadership on the FA Technology Roadmap Committee. The Board encourages you to read about these award recipients on our website (asminternational.org/edfas). The Board of Directors strives to strengthen the visibility and credibility of the Society by providing value to EDFAS members, and through its volunteers’ beneficial contributions to our industry. The EDFAS Board of Directors thanks all the volunteers who make our Society the success that it is today. We are constantly looking for more volunteers to help shape the future. If you or someone you know is interested in helping, please contact an EDFAS board member today. DIRECTORS NEWS CONTINUED FROM PAGE 43 The 16th annual FIB SEM User Group Meeting was packed with two full days of presentations, posters, and close peer interactions at the Kossiakoff Center at the Johns Hopkins Applied Phys- ics Laboratory (APL) in Laurel, Md., on May 22-23, 2024. The meeting was a hybrid format with 119 atten- dees in person and 57 attendees online from across the globe. The organizers laid out an agenda with FIB and SEM presentations covering instrumentation, biological and organic science applications, material science, and semiconductor use cases. The plenary speaker, Jacques Gierak from the French National Centre for Scientific Research (CNRS) spoke on ion source development for new gallium and ionic liquid emitters. Additional presentations from major FIB SEM manufacturers, universities, institutes, and companies discussed topics such as direct electron detection with SEM, laser FIB combination topics in the biological and material science, cryo FIB SEM applications, semiconductor challenges and solutions, as well as the latest software applications development for quantification and segmentation. This year there were also two student award winners, Rachel Ord from McMaster University and Madeline Barry from NIH. The meeting was jointly hosted by the FIB SEM User Group and the Canadian Centre for Electron Microscopy (CCEM), McMaster University. The full agenda for the 2024 meeting is available at fibsem.net/meetings. The 17th annual meeting will be held May 6-7 at George Washington University in Washington D.C. For more information visit fibsem.net or contact fibsem2025@ fibsem.net. FIB SEM 2024: 16TH ANNUAL MEETING Michael DiBattista, Varioscale Inc. miked@varioscale.com FIB SEM SUMMARY
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