edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 27 NO. 1 40 2024 EDFAS AWARD WINNERS EDFAS AWARD WINNERS: RECOGNIZING INDUSTRY PIONEERS AND LEADERS Felix Beaudoin, FASM, Chair, EDFAS Awards and Nominations Committee Immediate Past President, EDFAS felix.beaudoin@globalfoundries.com The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. I am pleased to highlight the 2024 winners. The EDFAS Lifetime Achievement Award recognizes those who have given their time, knowledge, and abilities toward the advancement of the electronic device failure analysis industry. The 2024 award was given to Ted Lundquist posthumously. Ted was former senior manager of Zeiss Semiconductor PCM in Pleasanton, Calif. His citation reads: “Ted Lundquist is remembered for his dedicated board service, impactful contributions to conferences, and generosity in mentoring engineers. His groundbreaking work in FIB and lock-in thermography has revolutionized microelectronic device failure analysis.” Ted Lundquist, a distinguished physicist, obtained his doctorate from the University of Maryland and a B.S. in physics from MIT. Throughout his car- eer at Zeiss, FEI, and more, he left an indelible mark. Serving as CTO at DCG Systems, later acquired by FEI, he contributed significantly. Ted, who passed away in June 2021, was a stalwart in the EDFAS board and played a crucial role in organizing ISTFA. His legacy lives on through numerous publications and patents that have shaped the failure analysis field. The EDFAS President’s Award recognizes those who provided an exceptional amount of effort in their service to the Society. The 2024 awardee is Efrat Moyal, director, materials research, Carl Zeiss Microscopy, White Plains, N.Y. Her citation reads: “For 25 years of impactful innovation and inclusive community building, advancing materials research in the semiconductor, microscopy, and sample Members of Ted Lundquist’s family accepted the 2024 EDFAS Lifetime Achievement Award. Efrat Moyal (left) receives the 2024 EDFAS President's Award from Renee Parente. preparation industry, and for her continued dedication to volunteer service within EDFAS.” With a robust foundation in both the scientific and business realms, Efrat has more than 25 years of expertise in microscopy and sample preparation, tailored spe- cifically for the materials research and semiconductor industries. Throughout her professional career, she has focused on advancing technologies in microscopy and sample preparation, driving innovation from startups as well as established corporations to meet the needs of the material research and semiconductor sectors. Efrat has volunteered with EDFAS for more than 12 years, working to better the professional community by growing the ISTFA expo floor and founding the Women in Electronics Failure Analysis group, advocating for inclusivity, and empowering female participation in the field. Educated in business management at the University of Phoenix with further leadership training at MIT, Efrat is committed to leveraging her extensive technical knowledge and strategic acumen to deliver impactful solutions that advance current technologies and foster industry growth. Please join me in honoring Ted Lundquist and Efrat Moyal for their significant contributions to inventing improved industry techniques and providing key research and education to benefit the FA community. To con- tinue the recognition of worthy contributors, I urge you to send suggestions for next year’s award to me at felix. beaudoin@globalfoundries.com. To learn more, visit asminternational.org/edfas/societyawards.
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